Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-07T23:05:22.475Z Has data issue: false hasContentIssue false
  • English
  • Français

Stability of Pbl-xEuxTe Alloys

Published online by Cambridge University Press:  28 February 2011

L. Salamanca-Young ,
M. Wuttig  and
S. Nahm
L. Salamanca-Young
Affiliation:
University of Maryland, College Park, MD 20742, D.L. Partin and J. Hermans, General Motors Research Laboratories, Warren, MI 48090.
M. Wuttig
Affiliation:
University of Maryland, College Park, MD 20742, D.L. Partin and J. Hermans, General Motors Research Laboratories, Warren, MI 48090.
S. Nahm
Affiliation:
University of Maryland, College Park, MD 20742, D.L. Partin and J. Hermans, General Motors Research Laboratories, Warren, MI 48090.
Get access

Abstract

We present high resolution transmission electron microscopy results of Pbl-xEuxTe alloys that show evidence for a compositional instability for x ≈ 0.5 when the alloys are grown on BaF2 substrates. The Pbl-xEuxTe solid solution becomes stable at room temperature if a buffer layer of PbTe is grown on the BaF2 substrate prior to thegrowth of the Pb1-xEuxTe layer. The stabilization ofthe Pb1-xEuxTe solid solution is the result of the additional energy term due to the strain between the Pbl-xEuxTe film and the PbTe buffer layer. The estimated critical temperatures for decomposition of the Pb1-xEuxTe alloys with and without the PbTe buffer layer are ≈0 K and.≈ 366 K, respectively in accord with our1 experimental observations. We also present models for the structure of the decomposed phaseand use them to obtain simulated images using computing methods. The simulated images are compared with those obtained experimentally.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 138: Symposium Q – Characterization of the Structure and Chemistry of Defects in Materials , 1988 , 249
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Heremans, J., and Partin, D.L., Phys. Rev. B 37, 6311 (1988).Google Scholar
[2] Fukui, T., and Saito, H., Jpn. J. Appl. Phys. Part 2 23, 521 (1984).Google Scholar
[3] Cohen, R.M., Cherng, M.J., Benner, R.E. and Stringfellow, G.B., J. Appl. Phys. 57, 4817 (1985).Google Scholar
[4] Stringfellow, G. B., J. Electron. Mater. 11, 903, (1982).Google Scholar
[5] Cahn, J. W., Acta. Metall. 9, 795, (1961).Google Scholar
[6] Cowley, J.M. and Moodie, A.F., Acta Cryst. 10, 609, (1957).Google Scholar
[7] Salamanca-Young, L., Partin, D.L., and Heremans, J., J. Appl. Phys. 63, 1504, (1988).Google Scholar
[8] Salamanca-Young, L., Wuttig, M., Partin, D.L. and Heremans, J., Mat. Res. Soc. Symp. Proc. Vol. 103 in Multilayers: Synthesis, Properties and Non-Electronic Applications, (ed. by Barbee, T.W. Jr, Spaepen, F. and Greer, L. Mats. Res. Soc., Pittsburg, PA, 1988) pp. 133.Google Scholar
[9] Cahn, J. W., Acta. Metall. 10, 179, (1962).Google Scholar
[10] Partin, D. L., J. Electron. Mater. 13, 493, (1984).Google Scholar
[11] Flynn, C. P., Phys. Rev. Lett. 57, 599, (1986).Google Scholar
[12] Nahory, R. E., Pollack, M. A., Beebe, E.D., and Dewinter, J. C., J. Electrochem. Soc. 125, 1053, (1978).Google Scholar
[13] The multi-slice programs used in this work were obtained from Arizona State University and were written by O'Keefe, M.A. and Skarnulis, A. and later modified by Kuhl, D., Spence, J.C.H. and O'Keefe, M.A..Google Scholar