Hostname: page-component-f554764f5-68cz6 Total loading time: 0 Render date: 2025-04-21T10:11:13.541Z Has data issue: false hasContentIssue false
  • English
  • Français

Soft-Mode Phonons in SrTiO3 Thin Films Studied by Far-Infrared Ellipsometry and Raman Scattering

Published online by Cambridge University Press:  10 February 2011

A. A. Sirenko ,
C. Bernhard ,
A. Golnik ,
I. A. Akimov ,
A. M. Clark ,
J.-H. Hao  and
X. X. Xi
A. A. Sirenko
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, [email protected] edu
C. Bernhard
Affiliation:
Max-Planck-Institut für Festkörperforschung, D-70569 Stuttgart, Germany
A. Golnik
Affiliation:
Max-Planck-Institut für Festkörperforschung, D-70569 Stuttgart, Germany
I. A. Akimov
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, [email protected] edu
A. M. Clark
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, [email protected] edu
J.-H. Hao
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, [email protected] edu
X. X. Xi
Affiliation:
Department of Physics, the Pennsylvania State University, University Park, PA 16802, [email protected] edu
Get access

Abstract

We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 µm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm−1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 603: Symposium KK – Materials Issues for Tunable RF & Microwave Devices , 1999 , 245
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Auciello, O., Scott, J. F., and Ramesh, R., Physics Today 51, 22 (1998).10.1063/1.882324Google Scholar
2. Li, H.-Ch., Si, W., West, A. D., and Xi, X. X., Appl. Phys. Lett. 73,190 (1998).10.1063/1.121751Google Scholar
3. Li, H.-Ch., Si, W., West, A. D., and Xi, X. X., Appl. Phys. Lett. 73,464 (1998).10.1063/1.121901Google Scholar
4. Fuchs, D., Schneider, C. W., Schneider, R., and Rietschel, H., J. Appl. Phys., 85, 7362 (1999).10.1063/1.369363Google Scholar
5. McKee, R. A., Walker, F. J., and Chisholm, M. F., Phys. Rev. Lett., 81, 3014 (1998).10.1103/PhysRevLett.81.3014Google Scholar
6. Zhou, C. and Newns, D. M., J. Appl. Phys. 82, 3081 (1997).10.1063/1.366147Google Scholar
7. Basceri, C., Streiffer, S. K., Kingon, A. I., and Waser, R., J. Appi. Phys. 82, 2497 (1997).10.1063/1.366062Google Scholar
8. Akimov, I. A., Sirenko, A. A., Clark, A. M., Hao, J.-H., and Xi, X. X., unpublished.Google Scholar
9. Fröhlich, H., Theory of Dielectrics (Oxford: Clarendon Press, 1949).Google Scholar
10. Cochran, W., Adv. Phys. 9, 387 (1960).10.1080/00018736000101229Google Scholar
11. Cowley, R. A., Adv. Phys. 12, 421 (1963).10.1080/00018736300101333Google Scholar
12. Servoin, J. L., Luspin, Y., and Gervais, F., Phys. Rev. B 22, 5501 (1980).10.1103/PhysRevB.22.5501Google Scholar
13. Chaves, A. S., Barreto, F.C.S., and Ribeiro, L.A.A., Phys. Rev. Lett. 37, 618 (1976).10.1103/PhysRevLett.37.618Google Scholar
14. Axe, J. D., Harada, J., and Shirane, G., Phys. Rev. B 1, 1227 (1970).10.1103/PhysRevB.1.1227Google Scholar
15. Worlock, J. M. and Fleury, P. A., Phys. Rev. Lett. 19, 1176 (1967).10.1103/PhysRevLett.19.1176Google Scholar
16. Vogt, H., Phys. Rev. B 51, 8046 (1995).10.1103/PhysRevB.51.8046Google Scholar
17. Lindner, P. and Wignall, G., MRS Bulletin 24 (No. 12), 34 (1999).10.1557/S0883769400053707Google Scholar
18. Sirenko, A. A., Bernhard, C., Golnik, A., Clark, A. M., Hao, J.-H., Si, W., and Xi, X. X., accepted for publication in Nature (2000).Google Scholar
19. Sirenko, A. A., Akimov, I.A., Fox, J.R., Clark, A.M., Li, H.-Ch., Si, W., and Xi, X.X., Phys. Rev. Lett. 82, 4500 (1999).10.1103/PhysRevLett.82.4500Google Scholar
20. Wells, B. O. et al. , unpublished.Google Scholar
21. Henn, R., Bernhard, C., Wittlin, A., Cardona, M., and Uchida, S., Thin Solid Films 314–315, 643, (1998).Google Scholar
22. Berreman, D. W., Phys. Rev. 130, 2193 (1963).10.1103/PhysRev.130.2193Google Scholar