Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-28T11:28:00.158Z Has data issue: false hasContentIssue false

SEMICONDUCTOR BEHAVIOR OF 2, 5-AROMATIC DISUBSTITUTED PYROLLES, AN EXPERIMENTAL AND THEORETICAL STUDY

Published online by Cambridge University Press:  18 December 2012

L. Fomina
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
C. Y. León Valdivieso
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
G. Zaragoza Galán
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
M. Bizarro
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
I. P. Zaragoza
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
J. Godínez Sánchez
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
R. Salcedo
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México
A. Baeza
Affiliation:
Facultad de Química- Universidad Nacional Autónoma de México, Circuito Exterior s/n. C.U. A. Postal 70-360. Delegación Coyoacán. C.P. 04510. México D.F. México.
Get access

Abstract

Theoretical calculations were performed on 2, 5-aromatic substituted pyrroles which have a nitro-benzene or a cyano-benzene link to the nitrogen atom of the pyrrol fragment. The molecules manifested interesting semiconductor behavior that was confirmed when thin films were prepared and their corresponding electrical characterization undertaken. The reason for this behavior is discussed, with reference to the electron withdrawing feature of the substituents in the benzene chain.

Type
Articles
Copyright
Copyright © Materials Research Society 2012 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Brédas, J.L., Beljonne, D., Coropceanu, V., Cornil, J., Chem. Rev. 104, 4971 (2004).CrossRefGoogle Scholar
Facchetti, A., Beverina, L., van der Boom, M.E., Dutta, E.G., Pagani, G.A., Marks, T.J.J., Am. Chem. Soc. 128, 2142 (2006).CrossRefGoogle Scholar
Brédas, J.L., Street, G.B., Thémans, B., André, J.M., J. Chem. Phys. 83, 1323 (1985).CrossRefGoogle Scholar
Roncali, J., Chem. Rev. 97, 173 (1997).CrossRefGoogle Scholar
a) Salzner, U., Lagowski, J.B., Pickup, P.G., Poirier, R.A., J. Org. Chem. 64, 7419 (1999). b) R. Salcedo, J. Mol. Model. 13, 1027 (2007).CrossRefGoogle Scholar
Salzner, U., Synth. Metal. 101, 482 (1999).CrossRefGoogle Scholar
Schulte, K.E., Reisch, J., Walker, H., Chem. Ber. 98, 98(1965).CrossRefGoogle Scholar
Huerta, G., Fomina, L., Rumsh, L., Zolotukhin, M.G., Polymer Bulletin 57, 433 (2006).CrossRefGoogle Scholar
Dirlikov, S., Chen, Z., Wang, D., Polymer 34, 705 (1993).CrossRefGoogle Scholar
Becke, A.D., Phys. Rev. 38, 3098 (1988).CrossRefGoogle Scholar
Perdew, J.P., Wang, Y., Phys. Rev. B 45, 13244 (1992).CrossRefGoogle Scholar
a). Wu, C.J., Yang, L.H., Fried, L.E., Quenneville, J., Martinez, T.J., Phys. Rev. B 67, Art. No. 235101 (2003). b). Ch.W. Bauschlicher, J.W. Lawson, A. Ricca, Y.Xue, M.A. Ratner, Chem Phys. Lett. 388, 427 (2004). CrossRefGoogle Scholar
Frisch, M.J., Trucks, G.W., Schlegel, H.B., Scuseira, G.E., Robb, M.A., Cheeseman, J.R., Zakrzewski, V.G. Jr. Montgomery, J.A., Stratmann, R.E., Burant, J.C., Dapprich, S., Millam, J.M., Daniels, A.D., Kudin, K.N., Strain, M.C., Farkas, O., Tomasi, J., Barone, V., Cossi, M., Cammi, R., Menucci, B., Pomelli, C., Adamo, C., Clifford, S., Ochterski, J., Petersson, G.A., Ayala, P.Y., Morokuma, K., Malick, D.K., Rabuck, A.D., Raghavachari, K., Foresman, J.B., Cioslowski, J., Ortiz, J.V., Stefanov, B.B., Liu, G., Liashenko, A., Piskorz, P., Komaromi, I., Gomperts, R., Martin, L.R., Fox, D.J., Keith, T., Al-Laham, M.A., Peng, C.Y., Nanayakkara, A., Gonzalez, C., Challacombe, M., Gill, P.M.W., Johnson, B.G., Chen, W., Wong, M.W., Andres, J.L., Head-Gordon, M., Replogle, E.S., Pople, J.A., Gaussian98, Gaussian Inc., Pittsburgh, PA (1998).Google Scholar
a) Krygowski, T.M., J. Chem. Inf. Comput. Sci. 33, 70 (1993). b) J. Kruszewski, T.M. Krygowski, Tetrahedron Lett. 1972, 3839 (1972). c). T.M. Krygowski, R. Anulewicz, Kruszewski, J. Acta Cryst. B 39, 732 (1983). d) T.M. Krygowski, M.K. Cyranskinski, Chem. Rev. 101, 1385 (2001).CrossRefGoogle Scholar
Chalk, A.J., Tetrahedron 30, 1387 (1974).CrossRefGoogle Scholar