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Segregation of Yttrium at Grain Boundaries in α-Al2O3
Published online by Cambridge University Press: 21 March 2011
Abstract
Quantitative X-ray analysis allows the investigation of yttrium-doped grain boundaries. In the present study well-defined bicrystal interfaces were characterized. The quantitative comparison of segregation at different bicrystals requires a correction of artifacts in the X-ray spectra due to mass absorption, fluorescence, and beam spread. Mean grain boundary excess values of 3 Y/nm2 and around 5 Y/nm2 were found at a ∑17 and ∑37 symmetrical grain boundary, respectively. Additionally, with the ∑17 bicrystal YAG precipitation and presence of silicon was found.
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- Copyright © Materials Research Society 2001
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