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Segregation of Yttrium at Grain Boundaries in α-Al2O3

Published online by Cambridge University Press:  21 March 2011

Stefan Nufer
Affiliation:
Max-Planck-Institut für Metallforschung, Seestr. 92, 70174 Stuttgart, Germany
Wolfgang Kurtz
Affiliation:
Max-Planck-Institut für Metallforschung, Seestr. 92, 70174 Stuttgart, Germany
Manfred Rühle
Affiliation:
Max-Planck-Institut für Metallforschung, Seestr. 92, 70174 Stuttgart, Germany
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Abstract

Quantitative X-ray analysis allows the investigation of yttrium-doped grain boundaries. In the present study well-defined bicrystal interfaces were characterized. The quantitative comparison of segregation at different bicrystals requires a correction of artifacts in the X-ray spectra due to mass absorption, fluorescence, and beam spread. Mean grain boundary excess values of 3 Y/nm2 and around 5 Y/nm2 were found at a ∑17 and ∑37 symmetrical grain boundary, respectively. Additionally, with the ∑17 bicrystal YAG precipitation and presence of silicon was found.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

[1] Cho, J., Harmer, M. P., Chan, H. M., Rickman, J. M., and Thompson, A. M., “Effect of Yttrium and Lanthanum on the Tensile Creep Behavior of Aluminum Oxide,” Jour. Am. Ceram. Soc., vol. 80, pp. 10131017, 1997.Google Scholar
[2] Loudjani, M. K., Roy, J., Huntz, A. M., and Cortes, R., “Study by Extended X-Ray Absorption Fine-Structure Technique and Microscopy of the Chemical State of Yttrium in α-Polycrystalline Alumina,” Jour. Am. Ceram. Soc., vol. 68, pp. 559562, 1985.Google Scholar
[3] Cawley, J. D. and Halloran, J. W., “Dopant Distribution in Nominally Yttrium-Doped Alumina,” Jour. Am. Ceram. Soc., vol. 69, pp. C195–C196, 1986.Google Scholar
[4] Bender, B., Williams, D. B., and Notis, M. R., “Investigation of Grain-Boundary Segregation in Ceramic Oxides by Analytical Scanning Transmission Electron Microscopy,” Jour. Am. Ceram. Soc., vol. 63, pp. 542546, 1980.Google Scholar
[5] Gülgün, M. A. and Rühle, M., “Yttrium in Polycrystalline α-Alumina,” Key Engineering Materials, vol. 171–174, pp. 793800, 2000.Google Scholar
[6] Wang, C. M., , G. S. C. III, Chan, H. M., and Harmer, M. P., “Structural Features of Y-Saturated and Supersaturated Grain Boundaries in Alumina,” Acta mater., vol. 48, pp. 25792591, 2000.Google Scholar
[7] Fischmeister, H. F. et al. , “Solid State Bonding of Accurately Oriented Metal/Ceramic Bicrystals in Ultrahigh Vacuum,” Rev. Sci. Instrum., vol. 64, pp. 234242, 1993.Google Scholar
[8] Sutton, A. P. and Baluffi, R. W., Interfaces in Crystalline Materials. Oxford: Claredon Press, 1995.Google Scholar
[9] Egerton, R. F., Electron Energy-Loss Spectroscopy in the Electron Microscope. New York: Plenum Press, 1996.Google Scholar
[10] Egerton, R. F., “A Data Base for Energy-Loss Cross Sections and Mean Free Paths,” 50th Ann. Proc. Electron Microsc. Soc. Amer., pp. 12641265, 1992.Google Scholar
[11] Alber, U., Müllejans, H., and Rühle, M., “Improved Quantification of Grain Boundary Segregation by EDS in a Dedicated STEM,” Ultramicroscopy, vol. 69, pp. 105116, 1997.Google Scholar
[12] Cliff, G. and Lorimer, G. W., “The Quantitative Analysis of Thin Specimens,” Jour. of Microsc., vol. 103, pp. 203207, 1975.Google Scholar