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Role of Surface on the Persistent Photoconductivity in Porous Silicon and Boron Doped a-Si:H

Published online by Cambridge University Press:  01 February 2011

S. C. Agarwal
Affiliation:
[email protected], I.I.T. Kanpur, PHYSICS, Department of Physics, I.I.T. Kanpur, kanpur, Uttar Pradesh, 208016, India, +91-512-2597085, +91-512-2590914
Abhishek Kumar
Affiliation:
[email protected], IIT Kanpur, Department of Physics, Kanpur, Uttar pradesh, 208016, India
N P Mandal
Affiliation:
[email protected], IIT Kanpur, Department of Physics, Kanpur, Uttar pradesh, 208016, India
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Abstract

The effect of ambient conditions on light soaking (LS) in porous silicon (PS) sample is studied. In vacuum LS on porous silicon increases dark current (DC) while in presence of water vapor it decreases DC. Interestingly, LS gives a higher DC in vacuum as well as in presence of water vapor for boron doped hydrogenated amorphous silicon a-Si:H(B) samples. A thin layer of polystyrene polymer almost eliminates the light induced degradation of porous silicon (PS) layers but can do so only to a smaller extent in a-Si:H(B). This shows that the effect of LS in PS is different than the effect of LS in a-Si:H(B) and that the surface plays a more important role in PS than in a-Si:H.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

[1] Canham, L. T., Appl. Phys. Lett. 57, 10461048 (1990).Google Scholar
[2] Bisi, O., Ossicini, S. and Pavesi, L., Surf. Sci. Reports. 38, 1 (2000).Google Scholar
[3] Mandal, N. P. and Agarwal, S. C., J. Mater. Sci.: Mater. Elctr. 14, 797798 (2003).Google Scholar
[4] Mandal, N. P. and Agarwal, S. C., Mater. Res. Soc. Symp. Proc. Vol 762, A17.18, Editors: Abelson, J. R., Ganguly, G., Matsumura, H., Robertson, J., Schiff, E. A., Spring 2003, San Francisco.Google Scholar
[5] Lakshmikumar, S. T. and Singh, P. K., J. Appl. Phys. 6, 3413 (2002).Google Scholar
[6] See for review, Fritzsche, H., Annual Review of Material Science 31, 47 (2001).Google Scholar
[7] Anandan, C., Mukherjee, C., Seth, T., Dixit, P. N. and Bhattacharya, R., Appl. Phys. Lett. 68, 835 (1996).Google Scholar
[8] Lee, W. H., Lee, H. and Lee, C., J. Non-Crys. Solids, 164–166, 965 (1993).Google Scholar
[9] Frello, T., Veje, E. and Leistiko, O., J. Appl. Phys., 79, 1027 (1996).Google Scholar
[10] Mandal, N P, Kumar, Abhishek and Agarwal, S C (accepted in J. Non-Cryst. Solids).Google Scholar
[11] Aker, B. and Fritzsche, H., J. Appl. Phys. 54, 6626 (1983).Google Scholar
[12] Mandal, N P, Sharma, Ashutosh and Agarwal, S C (accepted in J. Appl. Phys.)Google Scholar
[13] Mandal, N P, Sharma, Ashutosh and Agarwal, S C, Solid State Commun. 129, 183186 (2004).Google Scholar