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RF and Microwave Dielectric Measurements to 1400°C and Dielectric Loss Mechanisms

Published online by Cambridge University Press:  25 February 2011

R.M. Hutcheon ,
M.S. De Jong ,
F.P. Adams ,
P.G. Lucuta ,
J.E. McGregor  and
L. Bahen
R.M. Hutcheon
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario, Canada, KOJ 1JO
M.S. De Jong
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario, Canada, KOJ 1JO
F.P. Adams
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario, Canada, KOJ 1JO
P.G. Lucuta
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario, Canada, KOJ 1JO
J.E. McGregor
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario, Canada, KOJ 1JO
L. Bahen
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario, Canada, KOJ 1JO
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Abstract

A system has been developed, based on the cavity perturbation technique, for measuring the complex scalar permittivity of materials at frequencies between 50 MHz and 3 CHz, and up to a temperature of 1400°C. Measurements have been made on several classes of materials, including metallic oxides, conventional and advanced ceramics, fabrics, earthenwares, geological and biological materials, foods, glasses, organics and ferrites. Some materials remain unchanged by thermal cycling, but many undergo irreversible changes; the latter are of interest in microwave processing. The system measures the complex dielectric constant of materials during conventional heating, curing or sintering. Correlating these microwave measurements with other diagnostic techniques will help in the understanding of these processes in several classes of materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 269: Symposium L – Microwave Processing of Materials III , 1992 , 541
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

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