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Reliability Assurance for Thermo-Optic Solid State Optical Switches

Published online by Cambridge University Press:  10 February 2011

P. M. C. De Dobbelaere
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, [email protected]
P. J. Van Der Wel
Affiliation:
Akzo Nobel Photonics, PO Box 9300, 6800SB, Arnhem, The Netherlands, [email protected]
B. Hendriksen
Affiliation:
Akzo Nobel Photonics, PO Box 9300, 6800SB, Arnhem, The Netherlands, [email protected]
M. C. Flipse
Affiliation:
Akzo Nobel Photonics, PO Box 9300, 6800SB, Arnhem, The Netherlands, [email protected]
J. Thackara
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, [email protected]
N. Zhu
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, [email protected]
J. Freeman
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, [email protected]
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Abstract

The reliability assurance program for the BeamBoxTM thermo-optic solid state optical switches is presented. The different phases of the program are discussed, and some of the results are described.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

1. Tumolillo, T., et al., IEEE Communications Magazine (2), 124 (1997).Google Scholar
2. Bellcore Technical Reference TR-NWT-001073, Bellcore Generic Requirements GR-1221-CORE, Bellcore Technical Requirements TR-NWT-000357, Bellcore Technical Reference TR-NWT-000468Google Scholar
3. EIA/TIA-455, MIL-STD-883D, MIL-STD-750, MIL-STD-202, Bellcore Technical Reference TR-NWT-000456Google Scholar