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Rapid Electrical Sintering of Nanoparticle Stuctures

Published online by Cambridge University Press:  15 March 2011

Ari T. Alastalo ,
Tomi Mattila ,
Mark L. Allen ,
Mikko J. Aronniemi ,
Jaakko H. Leppäniemi ,
Kimmo A. Ojanperä ,
Mika P. Suhonen  and
Heikki Seppä
Ari T. Alastalo
Affiliation:
VTT Technical Research Centre of Finland, Tietotie 3, Espoo, P.O. Box 1000, FI-02044 VTT, Finland
Tomi Mattila
Affiliation:
VTT Technical Research Centre of Finland, Tietotie 3, Espoo, P.O. Box 1000, FI-02044 VTT, Finland
Mark L. Allen
Affiliation:
VTT Technical Research Centre of Finland, Tietotie 3, Espoo, P.O. Box 1000, FI-02044 VTT, Finland
Mikko J. Aronniemi
Affiliation:
VTT Technical Research Centre of Finland, Tietotie 3, Espoo, P.O. Box 1000, FI-02044 VTT, Finland
Jaakko H. Leppäniemi
Affiliation:
VTT Technical Research Centre of Finland, Tietotie 3, Espoo, P.O. Box 1000, FI-02044 VTT, Finland
Kimmo A. Ojanperä
Affiliation:
VTT Technical Research Centre of Finland, Tietotie 3, Espoo, P.O. Box 1000, FI-02044 VTT, Finland
Mika P. Suhonen
Affiliation:
VTT Technical Research Centre of Finland, Tietotie 3, Espoo, P.O. Box 1000, FI-02044 VTT, Finland
Heikki Seppä
Affiliation:
VTT Technical Research Centre of Finland, Tietotie 3, Espoo, P.O. Box 1000, FI-02044 VTT, Finland
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Abstract

A method for rapid electrical sintering (RES) of nanoparticle structures on temperature-sensitive substrates is presented. For an inkjetted silver nanoparticle conductor, a conductance increase of five orders of magnitude is demonstrated to occur in a timescale that typically varies between a few and one hundred milliseconds depending on process parameters. Furthermore, most of the conductance change takes only a few microseconds. The achievable final conductivities are within a factor of two from the bulk silver conductivity, as calculated using the external geometric dimensions of the structure ignoring porosity. The method is also applicable to other inorganic conductors such as indium-tin-oxide (ITO). More generally, the method offers a versatile tool in nanotechnology for electrical functionalization of nanoparticle structures. The method is also potentially suited for mass production.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1113: Symposium F – Low-Cost Solution-Based Deposition of Inorganic Films for Electronic/Photonic Devices , 2008 , 1113-F02-07
Copyright
Copyright © Materials Research Society 2009

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References

REFERENCES

1.Nanosolar, Erik Oldekop, Printed Electronics Europe 2008, www.nanosolar.com.Google Scholar
2.www.kovio.com; ElectronicsWeekly.com, Feb 11 2008; BusinessWeek, Dec 10 2007.Google Scholar
3. Subramanian, V., Frechet, J. M. J., Chang, P. C., Huang, D. C., Lee, J. B., Molesa, S. E., Murphy, A. R., Redinger, D. R., Volkman, S. K., Proc. IEEE, 93(7), July 2005.Google Scholar
4. Noh, Y.-Y., Cheng, X., Sirringhaus, H., Sohn, J. I., Welland, M. E. and Kang, D. J., Applied Physics Letters, 91, 043109 (2007).Google Scholar
5. Gamota, D. R., Brazis, P., Kalyanasundaram, K. and Zhang, J., Printed Organic and Molecular Electronics, Kluwer Academic Publishers, 2004.Google Scholar
6. Buffat, Ph. and Borel, J-P., Phys. Rev. A 132287–98 (1976).Google Scholar
7. Allen, M. L, Aronniemi, M., Mattila, T., Alastalo, A., Ojanperä, K., Suhonen, M. and Seppä, H., Nanotechnology 19 175201 (2008).Google Scholar
8. Allen, M. and Seppä, H., Patent Application WO2008009779A1.Google Scholar
9. Bieri, N.R., Chung, J., Haferl, S.E., Poulikakos, D. D and Grigoropoulos, C.P., Appl. Phys. Lett. 82 3529 (2003).Google Scholar
10. Schroder, K. A., McCool, S. C. and Furlan, W. R., NSTI Nanotech conference, Boston, May 7-11, 2006; www.novacentrix.com.Google Scholar
11. Perelaer, J., deGans, B.-J. and Schubert, U.S., Adv. Mater. 18 2101 (2006).Google Scholar
12. Allen, M., Alastalo, A., Aronniemi, M., Mattila, T., Sääskilahti, K., Suhonen, M. and Seppä, H., 1st International Conference on R2R Printed Electronics, Seoul, Korea, April 30 - May 2, 2008, pp. 291–296.Google Scholar