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Probing Optical Transitions in Porous Silicon by Reflectance Spectroscopy in the Near Infrared, Visible and UV

Published online by Cambridge University Press:  28 February 2011

W. Theiβ ,
R. Arens-Fischer ,
M. Arntzen ,
M.G. Berger ,
S. Frohnhoff ,
S. Hilbrich  and
M. Wernke
W. Theiβ
Affiliation:
I. Phys. Inst., Aachen University of Technology (RWTH), D-52056 Aachen, Germany
R. Arens-Fischer
Affiliation:
Institut fur Schicht- und Ionentechnik, Forschungszentrum Jülich, D-52425 Jülich, Germany
M. Arntzen
Affiliation:
I. Phys. Inst., Aachen University of Technology (RWTH), D-52056 Aachen, Germany
M.G. Berger
Affiliation:
Institut fur Schicht- und Ionentechnik, Forschungszentrum Jülich, D-52425 Jülich, Germany
S. Frohnhoff
Affiliation:
Institut fur Schicht- und Ionentechnik, Forschungszentrum Jülich, D-52425 Jülich, Germany
S. Hilbrich
Affiliation:
I. Phys. Inst., Aachen University of Technology (RWTH), D-52056 Aachen, Germany
M. Wernke
Affiliation:
I. Phys. Inst., Aachen University of Technology (RWTH), D-52056 Aachen, Germany
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Abstract

Reflectance spectroscopy has been used to obtain the dielectric function of the solid phase of porous silicon. The method is based on a fit of a parameterized dielectric function model to measured spectra. A crucial step in the procedure is the 'dielectric averaging' of the microscopic dielectric function of the pore wall material to the macroscopic effective dielectric function which governs the optical properties.

Results are given for heavily and moderately p-doped samples of various porosities. For the latter large differences to bulk silicon have been found. The obtained dielectric functions are compared to the results of band structure calculations taken from literature.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 358: Symposium F – Microcrystalline and Nanocrystalline Semiconductors , 1994 , 435
Copyright
Copyright © Materials Research Society 1995

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References

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