Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-08T00:28:47.018Z Has data issue: false hasContentIssue false

Porous Silicon from Hydrogenated Amorphous Silicon: Comparison with Crystalline Porous Silicon

Published online by Cambridge University Press:  15 February 2011

J.-N. Chazalviel
Affiliation:
Laboratoire de Physique de la Matière Condensée, CNRS-école Polytechnique, 91128 Palaiseau-Cedex, France
R. B. Wehrspohn
Affiliation:
Laboratoire de Physique de la Matière Condensée, CNRS-école Polytechnique, 91128 Palaiseau-Cedex, France
I. Solomon
Affiliation:
Laboratoire de Physique de la Matière Condensée, CNRS-école Polytechnique, 91128 Palaiseau-Cedex, France
F. Ozanam
Affiliation:
Laboratoire de Physique de la Matière Condensée, CNRS-école Polytechnique, 91128 Palaiseau-Cedex, France
Get access

Abstract

Device-grade, boron-doped amorphous hydrogenated silicon can be made microporous by anodization in ethanoic HF. The thickness of the porous layer is limited by an instability due to the high resistivity of the material. Amorphous porous silicon exhibits strong room-temperature photoluminescence around 1.5 eV even in samples containing a high density of non-radiative recombination centers. This demonstrates the presence of a spatial confinement effect, as opposed to quantum confinement effect for crystalline porous silicon. The temperature dependence of the luminescence intensity is also accounted for on the same grounds.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. See, e.g., Canham, L.T., Phys. Status Solidi (b) 190, 9 (1995) and references therein.Google Scholar
2.Bustarret, E., Ligeon, M. and Ortega, L., Solid State Commun. 83, 461 (1992).Google Scholar
3.Bustarret, E., Bruyère, J.-C., Muller, F. and Ligeon, M., MRS Symp. Proc. 283, 39 (1993).Google Scholar
4.Bustarret, E., Ligeon, M. and Rosenbauer, M., Phys. Status Solidi (b) 190, 111 (1995).Google Scholar
5.Jung, K.H., Shih, S., Kwong, D.L., Cho, C.C. and Gnade, B.E., Appl. Phys. Lett. 61, 2467 (1992).Google Scholar
6.Yakimov, A.I., Stepina, N.P., Dvurechenskii, A.V. and Scherbakova, L.A., Physica B 205, 298 (1995).Google Scholar
7.Estes, M.J., Hirsch, L.R., Wichart, S. and Moddel, G., MRS Spring Meeting 1996 (Symp. A).Google Scholar
8.Wehrspohn, R.B., Chazalviel, J.-N., Ozanam, F. and Solomon, I., EMRS Meeting (Strasbourg, June 1996) (to be published in Thin Solid Films).Google Scholar
9.Wehrspohn, R.B., Chazalviel, J.-N., Ozanam, F. and Solomon, I., Phys. Rev. Lett. 77, 1885 (1996).Google Scholar
10.Street, R.A., Hydrogenated Amorphous Silicon (Cambridge Solid State Science Series, Cambridge, 1991) and references therein.Google Scholar
11.Solomon, I., Benferhat, R. and Tran-Quoc, H., Phys. Rev. B 30, 3422 (1984).Google Scholar
12.Swanepoel, R., J. Phys. E: Sci. Instrum. 16, 1214 (1983).Google Scholar
13.Mullins, W.W. and Sekerka, R.F., J. Appl. Phys. 35, 444 (1964).Google Scholar
14.Lérondel, G., Romestain, R., Madéore, F. and Muller, F., Thin Solid Films 276, 80 (1996).Google Scholar
15.Canham, L.T., private communication.Google Scholar
16.Ozanam, F., Chazalviel, J.-N. and Wehrspohn, R.B., EMRS Meeting (Strasbourg, June 1996) (to be published in Thin Solid Films).Google Scholar
17.Unagami, T. and Kato, K., Jpn. J. Appl. Phys. 16, 165 (1977).Google Scholar
18.Mizuno, H., Koyama, H. and Koshida, N., Thin Solid Films (to be published).Google Scholar
19.Collins, R.W., Paesler, M.A. and Paul, W., Solid State Commun. 34, 833 (1980).Google Scholar
20.Abeles, B. and Tiedje, T., Phys. Rev. Lett. 51, 2003 (1983).Google Scholar
21.Miyazaki, S. and Hirose, M., in Amorphous and Macrocrystalline Semiconductor Devices: Optoelectronic Devices, ed. by Kanicki, J. (Artech, Boston, 1991) chap. 5, pp. 180183.Google Scholar
22.Koehler, S.A. and Fritzsche, H., MRS Spring Meeting 1996 (Symp. A).Google Scholar
23.Allan, G., Delerue, C. and Lannoo, M., MRS Fall Meeting 1996 (Symp. Q).Google Scholar
24.Yonezawa, F. and Satoh, F., Phil. Mag. B 60, 109 (1989).Google Scholar
25.Estes, M.J. and Moddel, G., Appl. Phys. Lett. 68, 1814 (1996).Google Scholar
26.Yablonovitch, E., Aliara, D.L., Chang, C.C., Gmitter, T. and Bright, T.B., Phys. Rev. Lett. 57, 249 (1986).Google Scholar
27.Wehrspohn, R.B. et al. (to be published).Google Scholar
28.Tessler, L.R. and Solomon, I., Phys. Rev. B 52, 10962 (1995).Google Scholar
29. DLockwood, J., Lu, Z.H. and Baribeau, J.-M., Phys. Rev. Lett. 76, 539 (1996).Google Scholar