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Piezoresponse Measurement and Imaging of Electromechanical PZT and PZN-BT thin Films

Published online by Cambridge University Press:  21 March 2011

C. Morros ,
M.H. Corbett ,
G. Catalan ,
J.M. Gregg  and
R.M. Bowman
C. Morros
Affiliation:
Condensed Matter Physics & Materials Science Research Division, School of Mathematics & Physics, Queen's University of Belfast Belfast BT7 1NN, UK
M.H. Corbett
Affiliation:
Condensed Matter Physics & Materials Science Research Division, School of Mathematics & Physics, Queen's University of Belfast Belfast BT7 1NN, UK
G. Catalan
Affiliation:
Condensed Matter Physics & Materials Science Research Division, School of Mathematics & Physics, Queen's University of Belfast Belfast BT7 1NN, UK
J.M. Gregg
Affiliation:
Condensed Matter Physics & Materials Science Research Division, School of Mathematics & Physics, Queen's University of Belfast Belfast BT7 1NN, UK
R.M. Bowman
Affiliation:
Condensed Matter Physics & Materials Science Research Division, School of Mathematics & Physics, Queen's University of Belfast Belfast BT7 1NN, UK
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Abstract

Pulsed laser deposition (PLD) was used to growth thin films of lead zirconium titanate (PZT) and lead zinc niobate-barium titanate (PZN-BT). The PZT films were prepared from commercial PZT-5H ceramic target and the PZN-BT made from target made using a modified Columbite method. The PZT films had dielectric constants of 300 and loss of 0.03 at 10kHz, whilst for the PZN-BT films they were 350 and 0.03 respectively at 300K. Hysteresis measurements confirmed their switching properties

A piezoresponse microscope based on a modified atomic force microscope was developed to determine electromechanical response at a sub-micrometer resolution. The PZT films yielded d33 ∼100pm/V. Mapping measurements on the PZT demonstrated local switching of individual grains. First measurements of piezoresponse of PZN-BT yielded values in the region 150-200 pm/V.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 655 , 2000 , CC11.8.1
Copyright
Copyright © Materials Research Society 2001

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