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Picosecond Transient Reflectance Measurements of Crystallization In Pure Metals

Published online by Cambridge University Press:  26 February 2011

C.A. MacDonald ,
A.M. Malvezzi  and
F. Spaepen
C.A. MacDonald
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
A.M. Malvezzi
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
F. Spaepen
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
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Abstract

The kinetics of rapid crystallization in metals is investigated by measuring transient optical property changes in laser irradiated gold and copper films in the picosecond and nanosecond regimes. Melt thresholds are determined by examining concentration profiles of multi-layered films before and after irradiation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 51: Symposium A – Beam-Solid Interactions and Phase Transformations , 1985 , 277
Copyright
Copyright © Materials Research Society 1985

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References

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