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PbZr0.53Ti0.47O3 (PZT) Thin Films on La0.5Sr0.5CoO3 (LSCO) Bottom Electrodes Prepared by Chemical Solution Deposition and Annealed at Different Temperatures

Published online by Cambridge University Press:  11 February 2011

Barbara Malic ,
Sasa Javoric ,
Marija Kosec ,
Ricardo Jiménez  and
Carlos Alemany
Barbara Malic
Affiliation:
Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia
Sasa Javoric
Affiliation:
Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia
Marija Kosec
Affiliation:
Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia
Ricardo Jiménez
Affiliation:
Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, 28049 Madrid, Spain
Carlos Alemany
Affiliation:
Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, 28049 Madrid, Spain
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Abstract

PbZr0.53Ti0.47O3 (PZT) films on La0.5Sr0.5CoO3 (LSCO) /Pt electrodes crystallize in the perovskite phase at 550°C. Cross section SEM shows a columnar grain structure of PZT films on fine-grained LSCO. The ferroelectric response of the heterostructures depends on the annealing temperature of the LSCO layer. The remanent polarization and coercive field of the PZT annealed at 550 °C deposited on LSCO annealed at 800 °C are 25 μC/cm2 and 99 kV/cm respectively, comparable to the values obtained for PZT films on platinized silicon substrate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 748: Symposium U – Ferroelectric Thin Films XI , 2002 , U12.17
Copyright
Copyright © Materials Research Society 2003

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References

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