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Out-of-phase Boundary (OPB) Nucleation in Layered Oxides

Published online by Cambridge University Press:  26 February 2011

Mark Zurbuchen ,
James Lettieri ,
Yunfa Jia ,
Altaf H. Carim ,
Stephen K. Streiffer  and
Darrell G. Schlom
Mark Zurbuchen
Affiliation:
[email protected], National Institute of Standards and Technology, 100 Bureau Dr MS 8520, Gaithersburg, MD, 20899, United States
James Lettieri
Affiliation:
[email protected], Penn State University
Yunfa Jia
Affiliation:
[email protected], Penn State University
Altaf H. Carim
Affiliation:
[email protected], US Department of Energy
Stephen K. Streiffer
Affiliation:
[email protected], Argonne National Laboratory
Darrell G. Schlom
Affiliation:
[email protected], Penn State University
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Abstract

Out-of-phase boundaries (OPBs), planar faults between regions of a crystal that are misaligned by a fraction of a unit cell dimension, occur frequently in materials of high structural anisotropy. Rarely observed in the bulk, OPBs frequently exist in epitaxial films of layered complex oxides, such as YBCO-type, Aurivillius, and Ruddlesden-Popper phases, and frequently propagate through the entire thickness of a film, due to their large offset and the improbability of opposite-sign OPB annihilation. OPBs have previously been demonstrated to have a significant impact upon properties, so it is important to understand their generation. These faults arise through the same few mechanisms in the various layered complex oxides.

An effort is made to unify the discussion of nucleation of these defects, common to layered oxide materials. OPBs can nucleate at the film-substrate interface (primary) via steric, chemical, or misfit mechanisms, or post-growth (secondary) through crystallographic shear during decomposition of volatile components. Examples of the mechanisms observed during high-resolution transmission electron microscopy (HRTEM) study of Aurivillius and Ruddlesden-Popper phases are presented. A method for estimating the relative OPB density in a film from correlation of x-ray diffraction (XRD) θ-2θ data with TEM information on OPBs is presented.

Keywords

transmission electron microscopy (TEM)defectslayered
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 902: Symposium T – Ferroelectric Thin Films XIII , 2005 , 0902-T10-55
Copyright
Copyright © Materials Research Society 2006

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