Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-28T09:45:08.130Z Has data issue: false hasContentIssue false
  • English
  • Français

Noise Analysis of Image Sensor Arrays for Large-Area Biomedical Imaging

Published online by Cambridge University Press:  01 February 2011

Jackson Lai ,
Denis Striakhilev ,
Yuri Vygranenko ,
Gregory Heiler ,
Arokia Nathan  and
Timothy Tredwell
Jackson Lai
Affiliation:
[email protected], Carestream Health Inc., Research and Innovation, 1049 Ridge Road West, Rochester, NY, 14615, United States, 585-477-0602
Denis Striakhilev
Affiliation:
[email protected], University of Waterloo, Department of Electrical and Computer Engineering, Waterloo, N2L 3G1, Canada
Yuri Vygranenko
Affiliation:
[email protected], University of Waterloo, Department of Electrical and Computer Engineering, Waterloo, N2L 3G1, Canada
Gregory Heiler
Affiliation:
[email protected], Carestream Health Inc., Rochester, NY, 14615, United States
Arokia Nathan
Affiliation:
[email protected], London Centre for Nanotechnology, London, N/A, United Kingdom
Timothy Tredwell
Affiliation:
[email protected], London Centre for Nanotechnology, London, N/A, United Kingdom
Get access

Abstract

Large area digital imaging made possible by amorphous silicon thin-film transistor (a-Si TFT) technology, coupled with a-Si photo-sensors, provides an excellent readout platform to form an integrated medical image capture system. Major development challenges evolve around optimization of pixel architecture for detector fill factor, and manufacturability, while suppressing noise stemming from pixel array and external electronics. This work discusses the behavior and modeling of system noise that arises from imaging array operations. An active pixel sensor (APS) design with on-pixel amplification is studied. Our evaluation demonstrates that a 17 inch by 17 inch array can achieve system noise as low as 1000 electrons through proper design and optimization.

Keywords

sensoramorphousbiomedical
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1066: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology—2008 , 2008 , 1066-A18-04
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Weckler, G. IEEE L. Solid-State Circuits, SC-2, 65, 1967.Google Scholar
2. Karim, K.S. Nathan, A. Rowlands, J.A. JVST A, 20(3), pp. 1095–1099, 2002.Google Scholar
3. Reif, F. Fundamentals of Statistical and Thermal Physics, McGraw-Hill, 1st edition, 1965.Google Scholar
4. Boundry, J.M. Antonuk, L.E. J. Appl. Phys., 76, pp. 2529–2534, 1994.Google Scholar
5. Johnson, J.B. Phys. Rev., 26, pp. 71–85, 1925.Google Scholar
6. McWhorter, A.L. “1/f noise and germanium surface properties,” Semiconductor Surface Physics, University of Pennsylvania Press, Philadelphia, pp. 207–228, 1956.Google Scholar
7. Hooge, F.N. Vandamme, L.K.J., Phys. Lett., 66A, pp. 316–326, 1978.Google Scholar
8. Mikoshiba, H. IEEE Trans. Elec. Dev., 29(6), pp. 965–970, 1982.Google Scholar
9. Hung, KK., Ko, P.K. Hu, C., Cheng, Y.C. IEEE Trans. Elec. Dev., 37 (3), pp. 654–665, 1990.Google Scholar
10. Karim, K.S. Nathan, A. Rowlands, J.A. in Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics and Imaging, SPIE TD01, pp. 358–360, 2002.Google Scholar
11. Hui, T. Abbas, E.G. Proc. SPIE, 3965, pp. 168–176, 2000.Google Scholar
12. Boundry, J.M. Antonuk, L.E. J. Appl. Phys., 76, pp. 2529–2534, 1994.Google Scholar
13. Hynecek, J. IEEE Trans. Elec. Dev., 37 (3), pp. 640–647, 1990.Google Scholar
14. Lai, J. Nathan, A. IEEE Trans. Elec. Dev., 52(10), pp. 2329–2332, 2005.Google Scholar