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New Frontiers in the Use of Microwave Energy: Power and Metrology

Published online by Cambridge University Press:  21 February 2011

Ralph W. Bruce
Ralph W. Bruce*
Affiliation:
Vanderbilt University, Electrical Engineering Department, Nashville, TN 37235
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Abstract

The Microwave/Radio Frequency portion of the electromagnetic spectrum has been used principally for the transmission and reception of information in communications and radar. With the advent of low cost commercial and consumer items (satellite downlinks and microwave ovens) has also come a resurgence of interest in using the energy and properties of these frequencies for other important tasks.

The purpose of this paper is to give a short review of the basics of electromagnetic heating and an overview of new trends in this use of microwave/RF energy. These trends can be divided into two broad categories: power and metrology.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 124: Symposium M – Microwave Processing of Materials I , 1988 , 3
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1. Metaxas, A.C. and Meredith, R.J., Industrial Microwave Heating, (Peter Peregrinus, Ltd., London, UK, 1983), p. 27.Google Scholar
2. Hayt, W.H. Jr., Engineering Electromaqnetics, 4th ed., (McGraw-Hill, New York, 1981), p. 392.Google Scholar
3. Metaxas, , Engineering Electromaqnetics, 4th ed., (McGraw-Hill, New York, 1981), p. 72.Google Scholar
4. Metaxas, , Engineering Electromaqnetics, 4th ed., (McGraw-Hill, New York, 1981), p. 80.Google Scholar
5. Roussy, G., Mercier, A., Thiebaut, J-M. and Vaubourg, J-P., J. Mic. Pwr., 20, 47 (1985).Google Scholar
6. Smith, R.D., EPRI Report EM-3645, 1984.Google Scholar
7. Gault, T.W. and Wilson, J., presented at the 1987 IMPI Symposium, Cincinnati, OH, 1987 (unpublished).Google Scholar
8. Lightsey, G.R. and Russell, L.D., presented at the Microwave Processing of Plastics Workshop, Chattanooga, TN, August, 1985 (unpublished).Google Scholar
9. Walkiewicz, J. W., Kazonich, G., and McGill, S.L., Min & Metal. Proc., p. 39, (February, 1988).Google Scholar
10. Debelak, K. (private communication)Google Scholar
11. Brodwin, M.E., Johnson, D.L., Tian, Y-L. and Tian, K-Y., presented at the 1987 IMPI Symposium, Cincinnati, OH, 1987 (unpublished).Google Scholar
12. Tinga, W.R., presented at the 1988 MRS Spring Meeting, Reno, NV, 1988 (unpublished).Google Scholar
13. Katz, J.D., Blake, R.D., Petrovic, J.J., and Sheinberg, H., presented at the 1988 MRS Spring Meeting, Reno, NV, 1988 (unpublished).Google Scholar
14. Palaith, D. and Silberglitt, R., presented at the 1988 MRS Spring Meeting, Reno, NV, 1988 (unpublished).Google Scholar
15. Fukushima, H., Yamanaka, T., and Matsui, M., presented at the 1988 MRS Spring Meeting, Reno, NV, 1988 (unpublished).Google Scholar
16. Paglione, R., Stetzer, F., Mendecki, J., Friedenthal, E., and Botstein, C., Mic. Jnrl., 24 (2), 71 (1981).Google Scholar
17. Iskander, M.F., presented at the 1988 MRS Spring Meeting, Reno, NV, 1988 (unpublished).Google Scholar
18. Westphal, W.B., in Dielectric Materials and Applications, edited by VonHippel, A.R. (The Technology Press of MIT and J.Wiley & Sons, New York, 1954), p. 63–122.Google Scholar
19. Ness, J., IEEE Trans. on MTT, MTT–33 (11), 1222–1226 (1985).CrossRefGoogle Scholar
20. Kobayashi, Y., Measuring Dielectric Constant with the HP8510 Network Analyzer (HP Product Note 8510–3, Palo Alto, CA, 1985).Google Scholar
21. Palaith, D.E. and Chang, S.K., J.Phys.E.: Sci. Instrum., 16, 227 (1983).Google Scholar
22. Bruce, R.W. and McCurdy, M.W., presented at the 1988 MRS Spring Meeting, Reno, NV, 1988 (unpublished).Google Scholar
23. Iskander, M.F. and Durney, C.H., Proc. IEEE, 67, 1463 (1979).CrossRefGoogle Scholar
24. Iskander, M.F., Durney, C. H., Schoff, D.J., and Bragg, D.G., Radio Science, 14, 265 (1979).Google Scholar
25. Iskander, M.F. and Durney, C.H., J. Mic. Pwr., 18 (3), 265 (1983).Google Scholar