Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-28T16:13:44.856Z Has data issue: false hasContentIssue false

Nanoengineering carbon nanotubes: The effects of electron irradiation on nanotube structure

Published online by Cambridge University Press:  21 February 2012

Katherine McDonell
Affiliation:
The University of Sydney, School of Civil Engineering, Sydney, N.S.W, Australia
Gwénaëlle Proust
Affiliation:
The University of Sydney, School of Civil Engineering, Sydney, N.S.W, Australia The University of Sydney, Australian Centre for Microscopy & Microanalysis, Sydney, N.S.W, Australia
Luming Shen
Affiliation:
The University of Sydney, School of Civil Engineering, Sydney, N.S.W, Australia
Get access

Abstract

A combined experimental and simulation approach into the impacts of electron irradiation on carbon nanotube morphology was conducted. Single-walled nanotubes (SWCNTs) were irradiated using a JEOL Transmission Electron Microscope (TEM) using a range of accelerating voltages varying from 90keV to 200keV and temperatures between 300K and 800K with different exposure periods (order of minutes). The effects of irradiation were observed and characterised using electron microscopy and Raman spectroscopy. Specimens were observed prior to, during and following irradiation to discern any changes that occurred in SWCNTs as a result of irradiation. Raman spectroscopy was used to characterise the different allotropes of carbon present in irradiated and non-irradiated samples of SWCNTs. Experimental conditions were mimicked using molecular dynamics simulation. SWCNTs were irradiated under conditions equivalent to experimental electron beam intensity and specimen temperature using AIREBO [1,2] and Primary Knock-on (PKA) approximation [3]. The preliminary results indicate that electron beam intensity and temperature affect the type and frequency of modification to CNT structure.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Stuart, S. J., Tutein, A. B. and Harrison, J. A., J. Chem. Phys. 112, 6472(2000)Google Scholar
2. Brenner, D. W., Shenderova, O. A., Harrison, J. A., Stuart, S. J., Ni, B. and Sinnott, S. B., J. Phys. Condens. Matter 14, 783 (2002)Google Scholar
3. Jang, I., Sinnott, S. B., Danailov, D. and Keblinski, P., Nano. Lett. 4, 1 (2004)Google Scholar
4. Iijima, S., Nature 354, 56 (1991)Google Scholar
5. Kis, , Csanyi, G., Salvetat, J. P., Lee, T. N., Couteau, E., Kulik, A. J., Benoit, W., Brugger, J. and Forro, L., Nat. Mater. 3, 3 (2004)Google Scholar
6. Li, J. and Banhart, F., Nano. Lett. 4, 6 (2004)Google Scholar
7. Terrones, M., Banhart, F., Grobert, N., Charlier, J-C., Terrones, H. and Ajayan, P. M., Phys. Rev. Lett. 89, 075505 (2002)Google Scholar
8. Morant, , Andrey, J., Prieto, P., Mendiola, D., Sanz, J. M., and Elizalde, E., Phys. Status Solidi A 203, 1069 (2006).Google Scholar
9. Krasheninnikov, A.V. and Nordlund, K., J. App. Phys. 107, 071301 (2010)Google Scholar
10. Charlier, J-C., Acc. Chem. Res. 35, 1063 (2002)Google Scholar
11. Salonen, E., Krasheninnikov, A. V. and Nordlund, K., Nuc. Instr. And Meth. B 193, 603 (2002)Google Scholar
12. Kim, K. W. and Jaksch, H, Micron 40, 724 (2009)Google Scholar
13. Plimpton, S., J. Comp. Phys. 117, 1 (1995)Google Scholar
14. Humphrey, W., Dalke A, A. and Schulten, K., J. Molec. Graphics 14.1, 33 (1996)Google Scholar
15. Gupta, S. and Patel, R. J., J. Raman Spectro. 38, 188 (2007)Google Scholar
16. Ferrari, A. C. and Robertson, J., Phys. Rev. B 61, 20 (2000)Google Scholar
17. Li, Q., Nia, Z., Gonga, J, Zhuaand, D. Zhua, Z., Carbon 46, 434 (2008)Google Scholar
18. Zobelli, A., Gloter, A., Ewels, C. P. and Colliex, C., Phys. Rev. B 77, 045410 (2008)Google Scholar
19. Ajayan, P. M., Ravikumar, V. and Charlier, J-C, Phys. Rev. Lett. 81, 1437 (1998)Google Scholar
20. Jung, Y. J., Homma, Y., Vajtai, R., Kobayashi, Y., Ojino, T and Ajayan, P. M., Nano. Lett. 4, 6 (2004)Google Scholar
21. Banhart, F., Rep. Prog. Phys. 62, 1181 (1999)Google Scholar