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Nanocrystalline Solutions as Precursors to The Spray Deposition of Cdte Thin Films

Published online by Cambridge University Press:  15 February 2011

Martin Pehnt ,
Douglas L. Schulz ,
Calvin J. Curtis ,
Helio R. Moutinho ,
Amy Swartzlander  and
David S. Ginley
Martin Pehnt
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden CO 80401-3393
Douglas L. Schulz
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden CO 80401-3393
Calvin J. Curtis
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden CO 80401-3393
Helio R. Moutinho
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden CO 80401-3393
Amy Swartzlander
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden CO 80401-3393
David S. Ginley
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden CO 80401-3393
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Abstract

In this article we report the first nanoparticle-derived route to smooth, dense, phase-pure CdTe thin films. Capped CdTe nanoparticles were prepared by injection of a mixture of Cd(CH3)2, (n-C8H17)3 PTe and (n-C8H17)3P into (n-C8H17)3PO at elevated temperatures. The resultant nanoparticles 32-45 Å in diameter were characterized by x-ray diffraction, UV-Vis spectroscopy, transmission electron microscopy, thermogravimetric analysis and energy dispersive x-ray spectroscopy. CdTe thin film deposition was accomplished by dissolving CdTe nanoparticles in butanol and then spraying the solution onto SnO2-coated glass substrates at variable susceptor temperatures. Smooth and dense CdTe thin films were obtained using growth temperatures approximately 200 °C less than conventional spray pyrolysis approaches. CdTe films were characterized by x-ray diffraction, UV-Vis spectroscopy, atomic force microscopy, and Auger electron spectroscopy. An increase in crystallinity and average grain size as determined by x-ray diffraction was noted as growth temperature was increased from 240 to 300 °C. This temperature dependence of film grain size was further confirmed by atomic force microscopy with no remnant nanocrystalline morphological features detected. UV-Vis characterization of the CdTe thin films revealed a gradual decrease of the band gap (i.e., elimination of nanocrystalline CdTe phase) as the growth temperature was increased with bulk CdTe optical properties observed for films grown at 300 °C.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 382: Symposium G – Structure and Properties of Multilayered Thin Films , 1995 , 461
Copyright
Copyright © Materials Research Society 1995

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