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Micro Raman Spectroscopy of Silicon Nanocrystals Produced by Picosecond Pulsed Laser Ablation

Published online by Cambridge University Press:  11 February 2011

M. H. Wu ,
R. Mu ,
A. Ueda ,
D. O. Henderson  and
B. Vlahovic
M. H. Wu
Affiliation:
Department of Physics, Fisk University, Nashville, TN 37208
R. Mu
Affiliation:
Department of Physics, Fisk University, Nashville, TN 37208
A. Ueda
Affiliation:
Department of Physics, Fisk University, Nashville, TN 37208
D. O. Henderson
Affiliation:
Department of Physics, Fisk University, Nashville, TN 37208
B. Vlahovic
Affiliation:
Department of Physics, North Carolina Central University, Durham, NC 27707
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Abstract

Pulsed laser ablation has been used to produce silicon nanocrystals. Variation of the laser fluence, backing gas type and pressure result in nanocrystals with controllable size distributions. Properties of nanocrystals produced with this method also depend on the distance of the nanocrystal from the center of the laser plume. Correlated atomic force microscopy and in-situ micro-Raman measurements confirm that particle size decreases as distance from the plume center increases. Silicon peaks in the micro raman spectra taken at increasing distance from plume center show considerable differences in both center energy and width. Confocal micro raman spectra from thicker (> 10 micron) samples show little variation with depth, in contrast with porous silicon samples.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 738: Symposium G – Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures , 2002 , G12.2
Copyright
Copyright © Materials Research Society 2003

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References

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