Published online by Cambridge University Press: 22 February 2011
A vertical high-speed, rotating disk reactor has been used to produce Al and CuAl alloy films on 125 mm diameter Si (100) wafers. Trimethylamine-alane and Cu (hexafluoroacetylacetonate) trimethylvinylsilane (CupraSelect™) were used as metal precursors. Aluminum films were deposited over the temperature range from ∼100 C to 700 C. Aluminum sheet resistance measurements showed the films to have resistance 2 to 3 times that of bulk Al films. CuAl alloy films were deposited sequentially and by codeposition. At 30 Torr, deposition rates as high as 3.7 um/hr, 0.024 um/hr, and 1 um/hr for Al, Cu, and CuAl films, respectively, were demonstrated. Auger analysis showed the deposited films to be free of contaminants.