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Lateral Heat Spreading in Layered Samples

Published online by Cambridge University Press:  31 January 2011

Daniele Fournier ,
Christian Fretigny ,
Mikaël Busson ,
Elika Saïdi ,
Lionel Aigouy ,
Jean Paul Roger ,
Nicolas Bergeal  and
Jérôme Lesueur
Daniele Fournier
Affiliation:
[email protected], UPMC, ESPCI 10 rue Vauquelin, PARIS, 75005, France, 33 1 40 79 46 02
Christian Fretigny
Affiliation:
[email protected], CNRS, PARIS, France
Mikaël Busson
Affiliation:
Laboratoire LPEM, UPR A0005 CNRS / UPMC, ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
Elika Saïdi
Affiliation:
Laboratoire LPEM, UPR A0005 CNRS / UPMC, ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
Lionel Aigouy
Affiliation:
Laboratoire LPEM, UPR A0005 CNRS / UPMC, ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
Jean Paul Roger
Affiliation:
Laboratoire LPEM, UPR A0005 CNRS / UPMC, ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
Nicolas Bergeal
Affiliation:
Laboratoire LPEM, UPR A0005 CNRS / UPMC, ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
Jérôme Lesueur
Affiliation:
Laboratoire LPEM, UPR A0005 CNRS / UPMC, ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
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Abstract

We describe two techniques dedicated to observe and study the heating of structured materials like micro and nanowires and multilayered compounds. The techniques are thermally modulated fluorescence and thermoreflectance. Thermally modulated fluorescence allows mapping the heating of devices with a sub-wavelength lateral resolution. Thermoreflectance allows deeper physical investigations and can be directly used to determine the thermal conductivity and diffusivity of layered structures. In particular, we will show that by thermally modulating a surface by a point-like source, we are able to determine such quantities for several geometries, taking into account the nature of the substrate (conductive or not) as well as the interface quality between the layers. The experimental results, measured on aluminum thin films of variable thickness and on vanadium dioxide layers are corroborated by an analytical model that analyzes both the amplitude and the phase of the lateral heat diffusion in the structure

Keywords

thermal conductivityphotoreflectancethin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1172: Symposium T – Nanoscale Heat Transport–From Fundamentals to Devices , 2009 , 1172-T04-01
Copyright
Copyright © Materials Research Society 2009

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