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Ion Beam Irradiation of Lanthanum Compounds in the Series La2O3-TiO2

Published online by Cambridge University Press:  01 February 2011

Karl Whittle
Affiliation:
[email protected], ANSTO, IME, New Illawara Road, Sydney, New South Wales, 2234, Australia
Mark Blackford
Affiliation:
[email protected], ANSTO, Institute of Materials Engineering, PMB1, Sydney, New South Wales, 2234, Australia
Robert Aughterson
Affiliation:
[email protected], ANSTO (Australian Nuclear Science and Technology Organisation), Institute of Materials Engineering, New Illawarra Road, Lucas Heights, NSW, Australia, 2234, Lucas Heights, New South Wales, 2234, Australia
Katherine L Smith
Affiliation:
[email protected], ANSTO, Institute of Materials Engineering, Sydney, New South Wales, Australia
Gregory R Lumpkin
Affiliation:
[email protected], ANSTO, Institute of Materials Engineering, Sydney, New South Wales, Australia
Nestor J Zaluzec
Affiliation:
[email protected], Argonne National Laboratory, Electron Microscopy Center, Chicago, Illinois, United States
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Abstract

Thin crystals of La2O3, La2/3TiO3, La2TiO5, and La2Ti2O7 have been irradiated in situ using 1 MeV Kr2+ ions in the Intermediate Voltage Electron Microscope-Tandem User Facility (IVEM-Tandem), at the Argonne National Laboratory (ANL). We observed that La2O3 remained crystalline to a fluence greater than 3.1 × 1016 ions cm-2 at a temperature of 50 K. The four binary oxide compounds in the two systems were observed through the crystalline-amorphous transition as a function of ion fluence and temperature. Results from the ion irradiations give critical temperatures for amorphisation (Tc) of 840 K for La2Ti2O7, 865 K for La2/3TiO3, and 1027 K for La2TiO5. The Tc values observed in this study, together with previous data for TiO2, are discussed with reference to the phase diagrams for La2O3-TiO2 systems and the different local environments within the crystal structures. Results suggest an observable inverse correlation between Tc and melting temperature (Tm) in the two systems.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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