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Investigation of Ferroelectric Properties of Vinylidene Fluoride Oligomer Evaporated Films

Published online by Cambridge University Press:  11 February 2011

K. Noda ,
K. Ishida ,
K. Mochizuki ,
A. Kubono ,
T. Horiuchi ,
H. Yamada  and
K. Matsushige
K. Noda
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
K. Ishida
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN PRESTO, Japan Science and Technology Corporation, JAPAN
K. Mochizuki
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
A. Kubono
Affiliation:
Department of Polymer Science and Engineering, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606–8585, JAPAN
T. Horiuchi
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
H. Yamada
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
K. Matsushige
Affiliation:
Department of Electronic Science and Engineering, Graduate School of Engineering, Kyoto University, Sakyo-ku, Kyoto 606–8501, JAPAN
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Abstract

Structures and electrical properties of newly synthesized vinylidene fluoride (VDF) oligomer [CF3(CH2CF2)17I] films evaporated onto various substrates around liquid nitrogen temperature were investigated. As a result, the VDF oligomer films were mainly formed with ferroelectric phase (form I) crystals and the molecular chains were oriented parallel to the substrate surfaces regardless of both the kind of the substrates and the thickness of the VDF oligomer films. In addition to these properties, the VDF oligomer films showed polarization reversal due to 180° rotation of the polar VDF oligomer molecules according to the applied voltages. This ferroelectric behavior was verified by local poling and piezoresponse measurements with an atomic force microscope, and by measurements of D-E hysteresis curves.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 748: Symposium U – Ferroelectric Thin Films XI , 2002 , U3.16
Copyright
Copyright © Materials Research Society 2003

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References

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