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Imaging, Structural and Chemical Analysis of Silicon Nanowires
Published online by Cambridge University Press: 11 February 2011
Abstract
Laser ablation has been used to grow silicon nanowires with an average diameter of 6.7 nm ± 2.7 nm surrounded by an amorphous SiOx sheath of 1–2 nm. This paper reports the imaging, chemical and structural analysis of these wires. Due to the growth temperature and the presence of calcium impurities and trace oxygen, two distinct types of wires are found. They appear to grow by two different processes. One requires a metal catalyst, the other is catalyzed by oxygen.
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- Copyright © Materials Research Society 2003
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