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Imaging Mechanism and Quantification of Scanning Probe Microscopies on Ferroelectric Surfaces

Published online by Cambridge University Press:  21 March 2011

Sergei V. Kalinin  and
Dawn A. Bonnell
Sergei V. Kalinin
Affiliation:
Dept. Mat. Sci. Eng., University of Pennsylvania, 3231 Walnut St, Philadelphia, PA 19104
Dawn A. Bonnell
Affiliation:
Dept. Mat. Sci. Eng., University of Pennsylvania, 3231 Walnut St, Philadelphia, PA 19104
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Abstract

In the last few years a wide spectrum of non-contact, intermittent contact and contact scanning probe microscopies have been applied to imaging ferroelectric surfaces. The imaging mechanism in non-contact SPM is ultimately related to the total charge distribution on the ferroelectric surface, including both polarization and screening charges. Contact voltage modulation (piezoresponse) force microscopy (PFM) is sensitive to both local polarization via electromechanical coupling and surface charge via capacitive interactions. In the present research we analyze the electrostatic and electromechanical contrast in PFM using analytical solutions for the electrostatic sphere-dielectric plane problem and for the piezoelectric indentation problem. The contribution of electrostatic forces to the image is estimated. Variable-temperature PRI imaging of domain structures in BaTiO3 is performed and the temperature dependence of the piezoresponse is compared with the Ginzburg - Devonshire theory.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 655 , 2000 , CC7.2.1
Copyright
Copyright © Materials Research Society 2001

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