Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-28T09:43:33.587Z Has data issue: false hasContentIssue false

High-Temperature Electromechanical Properties of CTGS

Published online by Cambridge University Press:  06 May 2014

Michal Schulz
Affiliation:
Institute of Energy Research and Physical Technologies, Clausthal University of Technology, Am Stollen 19 B, 38640 Goslar, Germany.
Holger Fritze
Affiliation:
Institute of Energy Research and Physical Technologies, Clausthal University of Technology, Am Stollen 19 B, 38640 Goslar, Germany.
Ward L. Johnson
Affiliation:
National Institute of Standards and Technology, 325 Broadway St., MS 647, Boulder, CO 80305, USA*
Get access

Abstract

CTGS (Ca3TaGa3Si2O14) is a commercially available, Czochralski-grown piezoelectric material from the langasite family that has an ordered crystal structure. It can be excited piezoelectrically up to at least 1285 °C, which is very close to the melting temperature of 1350 °C. In order to determine the loss at elevated temperatures, two different resonance techniques are used. A contactless transduction method is employed up to about 600 °C, whereas transduction involving standard keyhole-shaped film electrodes is employed up to 1285 °C. Comparison of the temperature-dependent inverse Q factor shows that contactless measurements are best suited for the lower temperature range, where sample clamping and losses caused by the electrodes contribute significantly to the total loss. However, at higher temperatures, measurement of the electrical impedance of samples with film electrodes in the vicinity of the resonance frequency proves to be suitable. Even at 1100 °C, 5 MHz CTGS resonators are found to have a Q factor of about 1200, which is great enough to enable numerous bulk-acoustic-wave applications. Further, a nearly linear temperature dependence of the resonance frequency with a temperature coefficient of 210 Hz/K makes Y-cut CTGS well suited for temperature-sensing applications.

Type
Articles
Copyright
Copyright © Materials Research Society 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Fritze, H., Meas. Sci. Technol. 22, 012002 (2011)CrossRefGoogle Scholar
Richter, D., Schulz, M., Sakharov, S., Davis, Z. J., Fritze, H., MRS Proceed. 1519 (2013)Google Scholar
Roshchupkin, D. V., Irzhak, D. V., Plotitsyna, O. A., Fakhrtdinov, R. R., J. Surf. Investig.-XRa. 6, 947950 (2012)CrossRefGoogle Scholar
Roshchupkin, D. V., Irzhak, D. V., Emelin, E. V., Fahrtdinov, R. R., Plotitsyna, O. A., Sakharov, S. A., Buzanov, O. A., Zabelin, A. N., Proc. IEEE Int. Ultrason. Symp., 27302733 (2012)Google Scholar
Macdonald, J.R., Barsoukov, E., Impedance spectroscopy: theory, experiment, and applications, Wiley-Interscience (2005)Google Scholar
Hsu, C. H., Mansfeld, F., Corrosion 57, 747 (2001)CrossRefGoogle Scholar
Ikeda, T., “Fundamentals of Piezoelectricity,” Oxford University Press (1996)Google Scholar
Johnson, W. L., Kim, S. A., Uda, S., Proc. 2003 IEEE Int. Freq. Contr., 646649 (2003)Google Scholar
Johnson, W. L., Kim, S. A., Uda, S., Rivenbark, C.F., J. Appl. Phys 110, 123528 (2011)CrossRefGoogle Scholar