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High-resolution Raman imaging by optically tweezing a dielectric microsphere

Published online by Cambridge University Press:  01 February 2011

Johnson Kasim ,
T. Yu ,
Y. M. You ,
J. P. Liu ,
A. K. H. See  and
Z. X. Shen
Johnson Kasim
Affiliation:
[email protected], Nanyang Technological University, Physics and Applied Physics, 1 Nanyang Walk, Blk 5 Level 3, Singapore, Singapore, 637616, Singapore
T. Yu
Affiliation:
[email protected], Nanyang Technological University, Physics and Applied Physics, 1 Nanyang Walk, Blk 5 Level 3, Singapore, 637616, Singapore
Y. M. You
Affiliation:
[email protected], Nanyang Technological University, Physics and Applied Physics, 1 Nanyang Walk, Blk 5 Level 3, Singapore, 637616, Singapore
J. P. Liu
Affiliation:
[email protected], Chartered Semiconductor Manufacturing Ltd., 60 Woodlands Industrial Park D, Street 2, Singapore, 738406, Singapore
A. K. H. See
Affiliation:
[email protected], Chartered Semiconductor Manufacturing Ltd., 60 Woodlands Industrial Park D, Street 2, Singapore, 738406, Singapore
Z. X. Shen
Affiliation:
[email protected], Nanyang Technological University, Physics and Applied Physics, 1 Nanyang Walk, Blk 5 Level 3, Singapore, 637616, Singapore
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Abstract

We show a different method in doing near-field Raman imaging with sub-diffraction limit spatial resolution. A dielectric microsphere (for example polystyrene microsphere) is trapped by optical tweezers. The microsphere is used to focus the laser to the sample, and also to collect the scattered Raman signals. We show the capability of this method in imaging various types of samples, such as SiGe/Si structures, gold nanopattern and carbon nanotubes. This method is comparatively easier to perform, better repeatability, and stronger signal than the normal near-field Raman techniques.

Keywords

nanoscaleRaman spectroscopyoptical
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1025: Symposium B – Nanoscale Phenomena in Functional Materials by Scanning Probe Microscopy , 2007 , 1025-B11-02
Copyright
Copyright © Materials Research Society 2008

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