Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Paul, D.J
Coonan, B
Redmond, G
O’Neill, B.J
Crean, G.M
Holländer, B
Mantl, S
Zozoulenko, I
Berggren, K.-F
Lazzari, J.-L
Arnaud d’Avitaya, F
and
Derrien, J
1998.
Silicon quantum integrated circuits – an attempt to fabricate silicon-based quantum devices using CMOS fabrication techniques.
Thin Solid Films,
Vol. 336,
Issue. 1-2,
p.
130.
Ross, F.M.
Bennett, P.A.
Tromp, R.M.
Tersoff, J.
and
Reuter, M.
1999.
Growth kinetics of CoSi2 and Ge islands observed with in situ transmission electron microscopy.
Micron,
Vol. 30,
Issue. 1,
p.
21.
Zhao, Q.T
Klinkhammer, F
Dolle, M
Kappius, L
and
Mantl, S
2000.
A novel silicide nanopatterning method for the fabrication of ultra-short channel Schottky-tunneling MOSFETs.
Microelectronic Engineering,
Vol. 50,
Issue. 1-4,
p.
133.
Zhao, Q. T.
Kluth, P.
Bay, H. L.
Lenk, St.
and
Mantl, S.
2004.
Nanopatterning of epitaxial CoSi2 using oxidation in a local stress field and fabrication of nanometer metal-oxide-semiconductor field-effect transistors.
Journal of Applied Physics,
Vol. 96,
Issue. 10,
p.
5775.