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Growth and Evaluation of [AFeOx/REFeO3] (A=Ca, Sr, RE=La, Bi) Superlattices by Pulsed Laser Deposition Method Using High Density Targets Prepared by Pechini Method

Published online by Cambridge University Press:  12 July 2012

Nobuyuki Iwata
Affiliation:
CST, Nihon Univ. 7-24-1 Narashinodai, Funabashi-shi, Chiba 274-8501, Japan
Yuta Watabe
Affiliation:
CST, Nihon Univ. 7-24-1 Narashinodai, Funabashi-shi, Chiba 274-8501, Japan
Yoshito Tsuchiya
Affiliation:
CST, Nihon Univ. 7-24-1 Narashinodai, Funabashi-shi, Chiba 274-8501, Japan
Kento. Norota
Affiliation:
CST, Nihon Univ. 7-24-1 Narashinodai, Funabashi-shi, Chiba 274-8501, Japan
Takuya Hashimoto
Affiliation:
CHS, Nihon Univ., 3-25-40 Sakurajousui, Setagaya-ku, Tokyo 156-8550, Japan
Mark Huijben
Affiliation:
MESA+ Institute for Nanotechnology, Univ. of Twente, 7500AE Enschede, The Netherlands
Guus Rijnders
Affiliation:
MESA+ Institute for Nanotechnology, Univ. of Twente, 7500AE Enschede, The Netherlands
Dave H. A. Blank
Affiliation:
MESA+ Institute for Nanotechnology, Univ. of Twente, 7500AE Enschede, The Netherlands
Hiroshi Yamamoto
Affiliation:
CST, Nihon Univ. 7-24-1 Narashinodai, Funabashi-shi, Chiba 274-8501, Japan
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Abstract

The LaFeO3 and CaFeOX layers are grown using highly dense target prepared by Pechini method, with which accurate growth rate is achieved. Since the LaFeO3demonstrates the obvious RHEED oscillation until the end of growth, constant growth rate, and the step-terraces structure, the LFO is employed as a buffer and/or reference layer to determine the required pulses to deposit the thickness we desire in the superlattice. Superlattices show the clear satellite peaks and Laue oscillation in the XRD spectra as well as the oscillations caused by the film thickness with a flat surface and superstructure with a flat interface in the x-ray reflection spectrum. The streaky RHEED patterns and step-terraces surface are consistent with the results of spectra using x-ray.

Type
Articles
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

Ohtomo, A., Muller, D. A., Grazul, J. L. & Hwang, H. Y., NATURE 419, 378 (2002).CrossRefGoogle Scholar
Pauli, S A and Willmott, P R, J. Phys.: Condens. Matter 20, 264012 (2008).Google Scholar
Huijben, Mark, Brinkman, Alexander, Koster, Gertjan, Rijnders, Guus, Hilgenkamp, Hans, and Blank, Dave H. A., Adv. Mater. 21, 1665 (2009).CrossRefGoogle Scholar
Verbeeck, J., Bals, S., Kravtsova, A. N., Lamoen, D., Luysberg, M., Huijben, M., Rijnders, G., Brinkman, A., Hilgenkamp, H., Blank, D. H. A., and Van Tendelool, G., Phys. Rev. 81, 085113 (2010).CrossRefGoogle Scholar
Pentcheva, R., Huijben, M., Otte, K., Pickett, W. E., Kleibeuker, J. E., Huijben, J., Boschker, H., Kockmann, D., Siemons, W., Koster, G., Zandvliet, H. J.W., Rijnders, G., Blank, D. H. A., Hilgenkamp, H., and Brinkman, A., Phys. Rev. Lett. 104, 166804 (2010).CrossRefGoogle Scholar
Siemons, Wolter, Huijben, Mark, Rijnders, Guus, Blank, Dave H. A., Geballe, Theodore H., Beasley, Malcolm R., and Koster, Gertjan, Phys. Rev. B81, 241308R (2010).CrossRefGoogle Scholar
Segal, Y., Ngai, J. H., Reiner, J. W., Walker, F. J., and Ahn, C. H., Phys. Rev. B80, 241107 (2009).CrossRefGoogle Scholar
Kanamori, J., J. Phys. Chem. Solids 10, 87 (1959).CrossRefGoogle Scholar
Goodenough, J. B., Phys. Rev. 100, 564 (1955).CrossRefGoogle Scholar
Iwata, N., Yamamoto, H., Huijben, M., Rijnders, G., Blank, D. H. A., Mater. Res. Soc. Symp. Proc. 1292, K12–16, 125 (2011).CrossRefGoogle Scholar
Tsuchiya, Y., Norota, K., Watabe, Y., Kuroda, T., Iwata, N., Hashimoto, T., Yamamoto, H., Trans. Mater. Res. Soc. Jpn. (2012) will be published.Google Scholar
Satio, K., Ulyanenkov, A., Grossmann, V., Ress, H., Bruegemann, L., Ohta, H., Kurosawa, T., Ueki, S., and Funakubo, H., Jpn. J. Appl. Phys. 45, 7311 (2006).Google Scholar