Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-28T11:07:35.070Z Has data issue: false hasContentIssue false

Group III Metal Sulfide Thin Films From Single-Source Precursors by Chemical Vapor Deposition (CVD) Techniques

Published online by Cambridge University Press:  10 February 2011

Mike R. Lazell
Affiliation:
Manchester Materials Sciences Centre and Department of Chemistry, University of Manchester, Oxford Road, Manchester, M13 9PL, UK
Paul O'brien
Affiliation:
Manchester Materials Sciences Centre and Department of Chemistry, University of Manchester, Oxford Road, Manchester, M13 9PL, [email protected]
David J. Otway
Affiliation:
Department of Chemistry, Imperial College of Science, Technology and Medicine, Exhibition Road, London, SW7 2AY, UK
Jin-Ho Park
Affiliation:
Department of Chemistry, Imperial College of Science, Technology and Medicine, Exhibition Road, London, SW7 2AY, UK Email: [email protected]
Get access

Abstract

Several single-source precursors including In(SOCNiBu2)3, In(S2CNMeHex)3 and Ga(S2CNMeR)3, (R = Et, Bu, Hex) have been prepared and used for the deposition of Group 13 metal sulfide thin films. The α and β-In2S3thin films on borosilicate glass and oc-Ga 2S3thin films on GaAs(111) single crystal substrates were prepared from the precursors by various chemical vapour deposition (CVD) techniques. These semicondcuting materials have been characterized by XRD, SEM, XPS and EDAX.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Coucouvanis, D., Prog. Inorg. Chem. 26, 301 (1979).Google Scholar
2 Jones, A. C. and O'Brien, P., CVD of Compounds Semiconductors, (VCH, Weinhemn, 1997), ch 1, pp. 22-23; ch. 7, pp. 307309.Google Scholar
3 Nomura, R., Fujii, S., Kanaya, K. and Matsuda, H., Polyhedron 9, 361 (1990).Google Scholar
4 Nomura, R., Konishi, K. and Matsuda, H., Thin Solid Films 198, 339 (1991).Google Scholar
5 Gysling, H. J., Wernberg, A. A. and Blanton, T. N., Chem. Mater. 9, 900 (1992).Google Scholar
6 Zheng, G., Kunze, K., Hampden-Smith, M. J. and Duesler, E. N., Adv. Mater., Chem. Vap. Dep. 2, 242 (1996).Google Scholar
7 Bessergenv, V. G., Ivanona, E. N., Kovalevskaya, Y. A., Gromilov, S. A., Kirichenko, V. N. and Larionov, S. V., Inorg. Mater. 32, 592 (1996).Google Scholar
8 Haggata, S. W., Malik, M. A., Motevalli, M., O'Brien, P. and Knowles, J. C., Chem. Mater. 7, 716 (1995).Google Scholar
9 O'Brien, P., Otway, D. J. and Walsh, J. R., Thin Solid Films 315, 57 (1998).Google Scholar
10 O'Brien, P., Otway, D. J. and Walsh, J. R., Adv. Mater., Chem. Vap. Dep. 3, 227 (1997).Google Scholar
11 Chunggaze, M., Horley, G. A., O'Brien, P., White, A. J. P. and Williams, D. J., J. Chem. Soc. Dalton Trans. 4205 (1998).Google Scholar
12 Horley, G. A., O'Brien, P., Park, J. -H., White, A. J. P. and Williams, D. J., J. Mater. Chem. 9, 1289 (1999).Google Scholar
13 Horley, G. A., Lazell, M. R. and O'Brien, P., Adv. Mater., Chem. Vap. Dep. 5, 203 (1999).Google Scholar
14 Malik, M. A. and O'Brien, P., Adv. Mater. Opt. Electron. 3, 71 (1994).Google Scholar
15 Shang, G., Hampden-Smith, M. J. and Duesler, E. N., J. Chem. Soc. Chem. Commun. 1733 (1996).Google Scholar
16 Maclnnes, A. N., Power, M. B., Barron, A. R., Chem. Mater. 5, 1344 (1993).Google Scholar