Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-28T04:17:26.284Z Has data issue: false hasContentIssue false

Evolution of the optical band gap in Titanium-based Oxy-(Hydroxy)-Fluorides series

Published online by Cambridge University Press:  01 February 2011

Nicolas Penin
Affiliation:
[email protected], ICMCB-CNRS Bordeaux, France
Nicolas Viadere
Affiliation:
[email protected], ICMCB-CNRS Bordeaux, France
Damien Dambournet
Affiliation:
[email protected], ICMCB-CNRS Bordeaux, France
Alain Tressaud
Affiliation:
[email protected], ICMCB-CNRS Bordeaux, France
Alain Demourgues
Affiliation:
[email protected], Bordeaux Institute of Condensed Matter Chemistry- CNRS, 87 av du Dr Albert Schweitzer, PESSAC, Gironde, 33608, France
Get access

Abstract

The optical band gap related to the electronic structures as well as the refractive index function of the electronic polarizability of the network can be tailored by changing the nature and the number of anions into the vicinity of cations. New routes have been developed in order to prepare new divided Ti(IV)-based oxyfluorinated compounds. In these compounds, the optical absorptions appear at the UV-Vis frontier and the refractive index is always smaller than the one of equivalent oxides. The chemical bonding, the hybridation and the density of the network play key roles in the variation of the optical band gap and the refractive index. For this family of titanium-based oxyfluorides containing mixed anions, chemical compositions and structural features have been correlated to the optical band gap and the refractive index, i.e. the complex index of materials n(λ) + ik(λ). Several examples will be given in order to illustrate the potentialities of these new inorganic compounds by changing the F/Ti ratio and the cationic substitution.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Yang, Ping, Lu, Cheng, Hua, Nianping, and Du, Yukou, Mater. Lett. 57, 794 (2002).10.1016/S0167-577X(02)00875-3Google Scholar
2. Penin, N., Dambournet, D., Viadere, N., Weill, F., Isnard, O., Petricek, V., Tressaud, A., and Demourgues, A., to be published.Google Scholar
3. Egerton, R.F., “Electron Energy Loss Spectroscopy in the Electron Microscope.”, Plenum Press: New York (1986).Google Scholar
4. Goubin, F., Rocquefelte, X., Pauwels, D., Tressaud, A., Demourgues, A., Jobic, S., and Montardi, Y., J. Solid State Chem. 177, 2833 (2004).10.1016/j.jssc.2004.05.006Google Scholar
5. Vorres, K. and Donohue, J., Acta Cryst. 8, 25 (1955).10.1107/S0365110X55000054Google Scholar
6. Rocquefelte, X., Goubin, F., Montardi, Y., Viadere, N., Demourgues, A., Tressaud, A., Whangbo, M.H., and Jobic, S., Inorg. Chem. 44, 3589 (2005).10.1021/ic048259wGoogle Scholar