Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-24T18:04:53.686Z Has data issue: false hasContentIssue false
  • English
  • Français

Evolution of correlated electron behavior from the surface to the bulk in SrxCa1-xVO3

Published online by Cambridge University Press:  16 March 2015

J. Laverock ,
B. Chen ,
J. Kuyyalil ,
R. P. Singh ,
G. Balakrishnan ,
R. M. Qiao ,
W. L. Yang ,
J. Adell ,
B. Karlin  and
J. C. Woicik
...Show all authors
J. Laverock
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215, U.S.A.
B. Chen
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215, U.S.A.
J. Kuyyalil
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215, U.S.A.
R. P. Singh
Affiliation:
Department of Physics, University of Warwick, Coventry CV4 7AL, United Kingdom
G. Balakrishnan
Affiliation:
Department of Physics, University of Warwick, Coventry CV4 7AL, United Kingdom
R. M. Qiao
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, U.S.A.
W. L. Yang
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, U.S.A.
J. Adell
Affiliation:
MAX-lab, Lund University, SE-221 00 Lund, Sweden
B. Karlin
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, U.S.A.
J. C. Woicik
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, U.S.A.
K. E. Smith
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215, U.S.A. School of Chemical Sciences and The MacDiarmid Institute for Advanced Materials and Nanotechnology, University of Auckland, Auckland 1142, New Zealand
Get access

Abstract

We present a detailed depth-sensitive study of the evolution in correlated electron behavior from the surface of the prototypical correlated oxide, SrxCa1-xVO3, to its bulk. Photoemission measurements of varying surface sensitivity are employed to directly compare both the spectral weight and energetics of the correlated electron features, and resonant soft x-ray emission spectroscopy is used as a bulk-sensitive reference. The surface component, which still contributes significantly to photoemission at 2.2 keV, is characterized by a transfer of spectral weight into the incoherent lower Hubbard band and the corresponding shift of these states towards lower binding energy.

Keywords

surface chemistryx-ray photoelectron spectroscopy (XPS)electronic structure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1730: Symposium N – Frontiers in Complex Oxides , 2015 , mrsf14-1730-n06-08
Copyright
Copyright © Materials Research Society 2015 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Yoshimatsu, K., Okabe, T., Kumigashira, H., et al. ., Phys. Rev. Lett. 104, 147601 (2010); Gu, M., Laverock, J., Chen, B., et al. , J. Appl. Phys. 113, 133704(2013).Google Scholar
Laverock, J., Chen, B., Smith, K. E., et al. ., Phys. Rev. Lett. 111, 047402 (2013).CrossRefGoogle Scholar
Sekiyama, A., Fujiwara, H., Imada, S., et al. ., Phys. Rev. Lett. 93, 156402 (2004).Google Scholar
Yoshida, T., Tanaka, K., Yagi, H., et al. ., Phys. Rev. Lett. 95, 146404 (2005); Aizaki, S., Yoshida, T., Yoshimatsu, K., et al. , Phys. Rev. Lett. 109, 056401(2012); Yoshida, Y., Hashimoto, M., Takizawa, T., et al. ., Phys. Rev. B 82, 085119 (2010); Maiti, K., Manju, U., Ray, S., et al. ., Phys. Rev. B 73, 052508 (2006); Pen, H. F., Abbate, M., Fujimori, A., et al. ., Phys. Rev. B 59, 7422 (1999); Mossanek, R. J. O., Abbate, M., Yoshida, T., et al. ., J. Phys.: Condens. Matter 22, 095601 (2010); Mossanek, R. J. O., Abbate, M., Yoshida, T., et al. ., Phys. Rev. B 78, 075103 (2008); Takizawa, M., Minohara, M., Kumigashira, H., et al. ., Phys. Rev. B 80, 235104 (2009).Google Scholar
Eguchi, R., Kiss, T., Tsuda, S., et al. ., Phys. Rev. Lett. 96, 076402 (2006).CrossRefGoogle Scholar
Maiti, K., Sarma, D. D., Rozenberg, M. J., et al. ., Europhys. Lett. 55, 246 (2001).Google Scholar
Liebsch, A., Phys. Rev. Lett. 90, 096401 (2003).CrossRefGoogle Scholar
Nekrasov, I. A., Keller, G., Kondakov, D. E., et al. ., Phys. Rev. B 72, 155106 (2005); Nekrasov, I. A., Held, K., Keller, G., et al. , Phys. Rev. B 73, 155112(2006); Byczuk, K., Kollar, M., Held, K., et al. ., Nature Phys. 3, 168 (2007); Gatti, M. and Guzzo, M., Phys. Rev. B 87, 155147 (2013); Sakuma, R., Werner, P., and Aryasetiawan, F., Phys. Rev. B 88, 235110 (2013).Google Scholar
Ishida, H., Wortmann, D., and Liebsch, A., Phys. Rev. B 73, 245421 (2006).CrossRefGoogle Scholar
Laverock, J., Piper, L. F. J., Preston, A. R. H., et al. ., Phys. Rev. B 85, 081104(R) (2012); Laverock, J., Preston, A. R. H., Newby, J., D., et al. ., Phys. Rev. B 86, 195124(2012).Google Scholar
Ament, L. J. P., van Veenendaal, M., Devereaux, T. P., et al. ., Rev. Mod. Phys. 83, 705 (2011); Laverock, J., Preston, A. R. H., Newby, J., , D., et al. ., Phys. Rev. B 84, 235111(2011); Laverock, J., Chen, B., Preston, A. R. H., et al. ., Phys. Rev. B 87, 125133 (2013); Laverock, J., Chen, B., Preston, A. R. H., et al. ., J. Phys.: Condens. Matter 26, 455603 (2014).Google Scholar
Inoue, I. H., Goto, O., Makino, H., et al. ., Phys. Rev. B 58, 4372 (1998).Google Scholar
Tanuma, S., Powell, C. J., and Penn, D. R., Surf. Interf. Anal. 21, 165 (1994).CrossRefGoogle Scholar