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Enhanced Light Absorption in Textured Metal Organic Chemical Vapour Deposited (MOCVD) CdO Thin Films

Published online by Cambridge University Press:  15 June 2012

Sunday O. Adekoya ,
Marcus A. Eleruja ,
Bolutife Olofinjana ,
Olumide O. Akinwunmi ,
Bidini A. Taleatu  and
Ezekiel O. B. Ajayi
Sunday O. Adekoya
Affiliation:
Department of Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria
Marcus A. Eleruja
Affiliation:
Department of Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria
Bolutife Olofinjana
Affiliation:
Department of Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria
Olumide O. Akinwunmi
Affiliation:
Department of Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria
Bidini A. Taleatu
Affiliation:
Department of Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria
Ezekiel O. B. Ajayi
Affiliation:
Department of Physics, Obafemi Awolowo University, Ile-Ife, 220005, Nigeria
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Abstract

The Single Solid Source precursor Cadmium Acetylacetonate, Cd[C5H7O2]2 was prepared and Cadmium Oxide thin films were deposited on Sodalime glass substrate using Metal Organic Chemical Vapour Deposition (MOCVD) technique at deposition temperature of 420 oC The films were characterized using Scanning Electron Microscopy (SEM) with Energy Dispersive XRay (EDX) facility attached to it, X-Ray Diffractometry (XRD) and UV-visible spectrometry. SEM micrographs showed the formation of textured surface with identifiable cubic and hexagonal structures, having average grain size greater than 1 μm. XRD studies indicated the formation of polycrystalline cubic CdO phase with preferred orientation in (111) plane. A direct optical band gap of 2.10 eV was obtained from the analysis of the UV-visible spectrum with an enhanced light absorption in 750 – 1000 nm spectrum range. This enhancement is as a result of light trapping by the textured crystalline structure.

Keywords

absorptionchemical compositionfilm
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1432: Symposium G – “Reliability and Materials Issues of III-V and II-VI Semiconductor Optical and Electron Devices and Materials II” , 2012 , mrss12-1432-g02-06
Copyright
Copyright © Materials Research Society 2012

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