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Electronic Structure Investigation of MAX-Phases by Soft X-ray Emission Spectroscopy

Published online by Cambridge University Press:  01 February 2011

Martin Magnuson
Martin Magnuson*
Affiliation:
[email protected], Uppsala University, Department of Physics, P. O. Box 530, Uppsala, S-75121, Sweden, +46-18-471-3524
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Abstract

The electronic structure of nanolaminate Ti2AlC and Ti2AlN thin films, so-called MAX-phases, were investigated by soft X-ray emission spectroscopy. These nanolaminated carbide and nitride compounds represent a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft X-ray emission technique is particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. The Ti-Al bonding is manifested by a pronounced peak in the Ti L-emission of Ti2AlC and Ti2AlN that is not present in the binary TiC system. The spectral shape of Al L-emission in the MAX-phase is strongly modified in comparison to metallic Al. By replacing or partly exchanging C with N, a change of the electron population can be achieved causing a change of covalent bonding between the laminated layers, which enables control of the material properties.

Keywords

electronic structurex-ray fluorescencenanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1023: Symposium JJ – Functional Nanoscale Ceramics for Energy Systems , 2007 , 1023-JJ09-01
Copyright
Copyright © Materials Research Society 2007

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References

1. Barsoum, M. W.; Prog. Solid State Chem. 28, 201 (2000).Google Scholar
2. Magnuson, M., Palmquist, J.-P., Mattesini, M., Li, S., Ahuja, R., Eriksson, O., Emmerlich, J., Wilhelmsson, O., Eklund, P., Högberg, H., Hultman, L., Jansson, U.; Phys. Rev. B 72, 245101 (2005).Google Scholar
3. Magnuson, M., Mattesini, M., Wilhelmsson, O., Emmerlich, J., Palmquist, J.-P., Li, S., Ahuja, R., Hultman, L., Eriksson, O. and Jansson, U., Phys. Rev. B. 74 205102 (2006)Google Scholar
4. Magnuson, M., Wilhelmsson, O., Palmquist, J.-P., Jansson, U., Mattesini, M., Li, S., Ahuja, R. and Eriksson, O., Phys. Rev. B. 74 195108 (2006).Google Scholar
5. Medvedeva, N. I., Novikov, D. L., Ivanovsky, A. L., Kuznetsov, M. V. and Freemena, A. J.; Phys. Rev. B 58, 16042 (1998).Google Scholar
6. Stoltz, S. E., Starnberg, H. I. and Barsoum, M. W.; J. Phys. and Chem. Of Solids; 64, 2321 (2003).Google Scholar
7. Myhra, S., Crossley, J. A. A. and Barsoum, M. W.; J. Phys. Chem. Solids; 62, 811 (2001).Google Scholar
8. Denecke, R., Vaterlein, P., Bassler, M., Wassdahl, N., Butorin, S., Nilsson, A., Rubensson, J.-E., Nordgren, J., Mårtensson, N. and Nyholm, R.; J. Electron Spectrosc. Relat. Phenom. 101–103, 971, (1999).Google Scholar
9. Nordgren, J. and Nyholm, R.; Nucl. Instr. Methods A246, 242 (1986); J. Nordgren, G. Bray, S. Cramm, R. Nyholm, J.-E. Rubensson and N. Wassdahl; Rev. Sci. Instrum. 60, 1690 (1989).Google Scholar
10. Magnuson, M., Mattesini, M., Li, S., Hoglund, C., Beckers, M., Hultman, L. and Eriksson, O.; Phys. Rev. B, in press (2007).Google Scholar
11. Magnuson, M., Wassdahl, N. and Nordgren, J.; Phys. Rev. B 56, 12238 (1997).Google Scholar
12. Ederer, D. L., Schaefer, R., Tsang, K.-L., Zhang, C. H., Callcott, T. A. and Arakawa, E. T.; Phys. Rev. B 37, 8594 (1988).Google Scholar
13. Ichikawa, K.; J. Phys. Soc. Jpn. 37, 377 (1994).Google Scholar
14. Zhou, Y., Sun, Z., Wang, X. and Chen, S.; J. Phys. Condens. Matter 13, 10001 (2001).Google Scholar
15. Kurmaev, E. Z., Ankudinov, A. L., Rehr, J. J., Finkelstein, L. D., Karimov, P. F. and Moewes, A.; J. Elec. Spec. 148, 1 (2005).Google Scholar