Published online by Cambridge University Press: 10 February 2011
Interfaces between glass and crystalline grains have been examined using a thin-film geometry which allows the use of newly developed experimental methods for micromechanical testing of interfaces. In this approach, continuous films of thicknesses ranging 100–200 nm of anorthite (CaAl2Si2O8), celsian (BaAl2Si2O8), and monticellite (CaMgSiO4) are deposited onto single-crystal Al2O3 (α-structure) surfaces of different crystallographic orientations by pulsed-laser deposition (PLD).
Mechanical properties such as hardness, stiffness, and reduced Young's modulus were probed with a newly developed high-resolution depth-sensing indentation instrument. Emphasis has been placed on examining how changes in the glass composition will affect the mechanical properties of the single-crystal Al2O3/silicate-glass interfaces. The indentation data obtained from these experiments correlate directly to the morphology of the deformed regions imaged with atomic force microscopy (AFM). Nanomechanical tests combined with AFM imaging of the deformed regions allow force-displacement measurements and in-situ imaging of the same regions of the specimen before and immediately after indentation. This new technique eliminates the uncertainty of locating the indenter after unloading.