Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-24T15:45:05.673Z Has data issue: false hasContentIssue false
  • English
  • Français

Dynamic photo-induced force microscopy

Published online by Cambridge University Press:  16 March 2015

Junghoon Jahng  and
Eric O. Potma
Junghoon Jahng
Affiliation:
Department of Physics and Astronomy, University of California at Irvine, Irvine CA 92697, U.S.A.
Eric O. Potma
Affiliation:
Department of Chemistry, University of California at Irvine, Irvine CA 92697, U.S.A.
Get access

Abstract

We provide a general description of the operating principle of the photo-induced force microscope (PiFM), which probes the optically induced changes in the dipolar interactions between a sharp polarizable tip and the sample, in terms of classical fields and forces. We rigorously calculate the photo-induced force behavior and compare the predicted profile with experimental results obtained from a gold nanowire.

Keywords

laser-induced reactionnanoscalescanning probe microscopy (SPM)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1754: Symposium OO/PP/QQ/TT – State-of-the-Art Developments in Materials Characterization , 2015 , pp. 103 - 108
Copyright
Copyright © Materials Research Society 2015 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Jahng, J., Brocious, J., Fishman, D. A., Huang, F., Li, X., Tamma, V. A., Wickramasinghe, H. K., and Potma, E. O., Phys. Rev. B 90, 155417 (2014).CrossRefGoogle Scholar
Rajapaksa, I., Uenal, K., and Wickramasinghe, H. K., Appl. Phys. Lett. 97, 073121 (2010).CrossRefGoogle Scholar
Garcia, R. and Herruzo, E. T., Nat. Nanotechnol. 7, 217 (2012).CrossRefGoogle Scholar
Lozano, J. R. and Garcia, R., Phys. Rev. B 79, 014110 (2009).CrossRefGoogle Scholar
Lee, M. and Jhe, W., Phys. Rev. Lett. 97, 036104 (2006); J. E. Sader and S. P. Jarvis, Appl. Phys. Lett. 84, 1801(2004); J. E. Sader et al., Nanotechnology 16, S94 (2005); B. Anczykowski et al., Appl. Surf. Sci. 140, 376 (1999).CrossRefGoogle Scholar