Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-24T14:27:58.306Z Has data issue: false hasContentIssue false
  • English
  • Français

The Direct Measurement of Ionic Piezoresistance

Published online by Cambridge University Press:  16 March 2015

Stuart N. Cook  and
Harry L. Tuller
Stuart N. Cook
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 USA
Harry L. Tuller
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 USA
Get access

Abstract

Ionic piezoresistance, the effect of lattice strain on ionic conductivity, is an important concept that needs to be harnessed to engineer the next generation of fast ionic conductors. To date there have been many reports of strain affecting changes in the level of ionic conductivity in solid electrolytes. The fundamental understanding is, however, still lacking, with limited experimental quantification of the magnitude of the effect. Here, we propose using the ionic piezoresistive coefficient, the constant of proportionality between the strain state and the change in conductivity, as a quantitative measure of this effect and detail a novel technique we have developed to quantify this in high temperature ionically conducting materials.

Keywords

ionic conductorpiezoresponsethin film
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1730: Symposium N – Frontiers in Complex Oxides , 2015 , mrsf14-1730-n10-05
Copyright
Copyright © Materials Research Society 2015 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Yahiro, H., Eguchi, Y., Eguchi, K., and Arai, H., J. Appl. Electrochem., 18, 527–531 (1988).CrossRefGoogle Scholar
Tianshu, Z., Hing, P., Huang, H., and Kilner, J.A., Solid State Ionics, 148, 567–573 (2002).CrossRefGoogle Scholar
Bayliss, R.D., Cook, S.N., Kotsantonis, S., Chater, R.J., and Kilner, J.A., Adv. Energy Mater., 4, 1301575 (2014).CrossRefGoogle Scholar
Garcia-Barriocanal, J., Rivera-Calzada, A., Varela, M., Sefrioui, Z., Iborra, E., Leon, C., Pennycook, S.J.J., and Santamaria, J., Science, 321, 676 (2008).CrossRefGoogle Scholar
Guo, X., Science, 324, 465 (2009).CrossRefGoogle Scholar
Cavallaro, A., Burriel, M., Roqueta, J., Apostolidis, A., Bernardi, A., Tarancón, A., Srinivasan, R., Cook, S.N., Fraser, H.L., Kilner, J.A., McComb, D.W., and Santiso, J., Solid State Ionics, 181, 592–601 (2010).CrossRefGoogle Scholar
Sillassen, M., Eklund, P., Pryds, N., Johnson, E., Helmersson, U., and Bottiger, J., Adv. Funct. Mater., 20, 2071–2076 (2010).CrossRefGoogle Scholar
Kosacki, I., Rouleau, C.M., Becher, P.F., Bentley, J., and Lowndes, D.H., Solid State Ionics, 176, 1319–1326 (2005).CrossRefGoogle Scholar
Kosacki, I., (2006).Google Scholar
Karthikeyan, A., Chang, C.-L., and Ramanathan, S., Appl. Phys. Lett., 89, 183116 (2006).CrossRefGoogle Scholar
Peters, A., Korte, C., Hesse, D., Zakharov, N., and Janek, J., Solid State Ionics, 178, 67–76 (2007).CrossRefGoogle Scholar
Guo, X., Vasco, E., Mi, S., Szot, K., Wachsman, E., and Waser, R., Acta Mater., 53, 5161 (2005).CrossRefGoogle Scholar
Korte, C., Peters, A., Janek, J., Hesse, D., and Zakharov, N., Phys. Chem. Chem. Phys., 10, 4623–4635 (2008).CrossRefGoogle Scholar
Sata, N., Eberman, K., Eberl, K., and Maier, J., Nature, 408, 946–949 (2000).CrossRefGoogle Scholar
Luth, H., “Solid Surfaces, Interfaces and Thin Films”, Springer, (2010), p.577.Google Scholar
Marrocchelli, D., From First-Principles to Fuel Cell Performance, in: Fall MRS, Boston (2014).Google Scholar
Kushima, A. and Yildiz, B., J. Mater. Chem., 20, 4809 (2010).CrossRefGoogle Scholar
Hirschfeld, J.A. and Lustfeld, H., Phys. Rev. B, 84, 224308 (2011).CrossRefGoogle Scholar
Aydin, H., Korte, C., and Janek, J., Sci. Technol. Adv. Mater., 14, 035007 (2013).CrossRefGoogle Scholar
Schichtel, N., Korte, C., Hesse, D., and Janek, J., Phys. Chem. Chem. Phys., 11, 3010 (2009).CrossRefGoogle Scholar
Korte, C., Schichtel, N., Hesse, D., and Janek, J., Monatshefte Fur Chemie / Chem. Mon., 140, 1069–1080 (2009).CrossRefGoogle Scholar
Korte, C., Schichtel, N., Hesse, D., and Janek, J., Monatshefte Für Chemie / Chem. Mon., 140, 1069–1080 (2009).CrossRefGoogle Scholar