Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-08T06:35:18.082Z Has data issue: false hasContentIssue false
  • English
  • Français

The Development of the Amorphous Phase in NiTi During Heavy Ion or Electron Bombardment

Published online by Cambridge University Press:  25 February 2011

J. L. Brimhall ,
H. E. Kissinger  and
A. R. Pelton
J. L. Brimhall
Affiliation:
Pacific Northwest Laboratory, Richland, WA 99352;
H. E. Kissinger
Affiliation:
Pacific Northwest Laboratory, Richland, WA 99352;
A. R. Pelton
Affiliation:
Ames Laboratory, Ames, IA 50011
Get access

Abstract

A supralinear dose dependence for the amorphous transformation was observed in NiTi during bombardment with 2.5 MeV Ni+ ions. These results are consistent with a mechanism that requires cascade overlap to obtain a critical defect density for the amorphous transformation. Direct amorphization in the cascades was not resolvable. The temperature dependence of the minimum dose required for complete amorphous transformation had the same form as that observed for amorphization of silicon. Amorphization caused by electron bombardment required a higher dose than by ion bombardment. Different degrees of homogeneity of the damage state between ions and electrons can explain the dose dependence on particle type.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 27: Symposium E – Ion Implantation and Ion Beam Processing of Materials , 1983 , 163
Copyright
Copyright © Materials Research Society 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Thompson, D. A., Rad. Eff., 56, 105 (1981).Google Scholar
2. Brimhall, J. L., Kissinger, H. E. and Charlot, L. A., Rad. Eff., 77, 237 (1983).Google Scholar
3. Pelton, A. R., Seventh Intl. Conf. on High Voltage Electron Microscopy, Fisher, R. M., Gronsky, R. and Westmacott, K. H. eds., LBL-16031, 1983, (NTIS, Springfield, VA) p. 245.Google Scholar
4. Howe, L. M. and Rainville, M. H., J. Nucl. Mat., 68, 215(1977).Google Scholar
5. Dennis, J. R. and Hale, E. B., J. Appl. Phys., 49, 119(1978).Google Scholar
6. Baranova, E. C., Gusev, V. M., Martynenko, Yu. V., Starinin, C. V. and Haibullin, I. B., Rad. Eff. 18, 21(1973).Google Scholar
7. Thompson, D. A., Golanski, A., Haugen, K. H., Stevanovic, D. V., Carter, G. and Christodoulides, C. E., Rad. Eff., 52, 69(1980).Google Scholar
8. Bartuch, V. and Karthe, W., Rad. Eff. Lett., 67, 187(1982).Google Scholar
9. Marwick, A. D., J. Nucl. Mat., 55, 259(1975).Google Scholar
10. Fujita, H., Mori, H. and Fujita, M., J. Nucl. Mat., 55 Ref. 3, p. 233.Google Scholar