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Degradation and Microstructure in II-VI Blue-Green Emitters

Published online by Cambridge University Press:  21 February 2011

S. Guha ,
H. Cheng ,
J. M. Depuydt ,
M. A. Haase  and
J. Qiu
S. Guha
Affiliation:
3M Corporate Research Labs, 3M Co., 3M Center, St. Paul, MN 55144-1000.
H. Cheng
Affiliation:
3M Corporate Research Labs, 3M Co., 3M Center, St. Paul, MN 55144-1000.
J. M. Depuydt
Affiliation:
3M Corporate Research Labs, 3M Co., 3M Center, St. Paul, MN 55144-1000.
M. A. Haase
Affiliation:
3M Corporate Research Labs, 3M Co., 3M Center, St. Paul, MN 55144-1000.
J. Qiu
Affiliation:
3M Corporate Research Labs, 3M Co., 3M Center, St. Paul, MN 55144-1000.
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Abstract

We report below a microstructural analysis of non-radiative microstructural defects formed during operation of II-VI compound semiconductor based blue-green light emitting diodes and lasers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 326: Symposium M – Growth, Processing, and Characterization of Semiconductor Heterostructures , 1993 , 9
Copyright
Copyright © Materials Research Society 1994

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References

1 Haase, M. A., Qiu, J., DePuydt, J. M., and Cheng, H., Appl. Phys. Lett. 59, 1272 (1991).Google Scholar
2 Petroff, P., and Hartman, R. L., Appl. Phys. Lett. 23, 469 (1973).Google Scholar