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Crystalline Texture Of Cocrpt Films On Crmn//ial And Cr/Nial Underlayer Structures

Published online by Cambridge University Press:  21 February 2011

J. Zou
Affiliation:
Department of Electrical and Computer EngineeringData Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213, jzou @ece.cmu.edu
B. Lu
Affiliation:
Department of Electrical and Computer EngineeringData Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213, jzou @ece.cmu.edu
A.E. Bayer
Affiliation:
Department of Materials Science and Engineering, Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213, jzou @ece.cmu.edu
D.E. Laughlin
Affiliation:
Department of Materials Science and Engineering, Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213, jzou @ece.cmu.edu
D.N. Lambeth
Affiliation:
Department of Electrical and Computer EngineeringData Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA 15213, jzou @ece.cmu.edu
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Abstract

In this study, we examine the effects of CrMn/NiAI and Cr/NiAl underlayer structures on the crystalline texture and microstructure of CoCrPt magnetic films using x-ray and electron diffraction. The former underlayer structure was found to induce better CoCrPt (1010) texture. The stress in the CoCrPt layer was measured. The effective in-plane anisotropy energy densities of the CoCrPt films on the above two underlayers were also measured by using out-of-plane torque and Miyajima methods and the result was consistent with the texture analysis.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

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