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Critical Current Density, Flux Creep, and Microstructure in A Bi-Sr-Ca-Cu-O System*

Published online by Cambridge University Press:  28 February 2011

Donglu Shi
Affiliation:
Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W–31–109–ENG–38.
M. S. Boley
Affiliation:
Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W–31–109–ENG–38.
J. G. Chen
Affiliation:
Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W–31–109–ENG–38.
Ming Xu
Affiliation:
Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W–31–109–ENG–38.
M. M. Fang
Affiliation:
Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W–31–109–ENG–38.
U. Welp
Affiliation:
Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W–31–109–ENG–38.
K. Vandervoort
Affiliation:
Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W–31–109–ENG–38.
J. M. Hong
Affiliation:
Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W–31–109–ENG–38.
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Abstract

We measured magnetization hysteresis and zero-field-cooled magnetic relaxation for liquid-quenched Bi-Sr-Ca-Cu-O samples at various temperatures. We found that there is a close correlation between the magnetic behavior and the microstructures of the samples. The magnetization hysteresis greatly increases in the samples with a large amount of crystal defects such as precipitates and stacking faults in the matrix of the material. We also found that the flux creep is reduced as a result of these microstructural changes.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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Footnotes

*

Work supported by the U. S. Department of Energy, BES-Materials Science, under Contract No. W-31-109-ENG-38.

References

1 Shi, D., Capone, D. W. II, Goudey, G. T., Singh, J. P., Zaluzec, N. J., and Goretta, K. C., Mater. Lett. 6(7), 217 (1988).Google Scholar
2 Ekin, J. W., Adv. Cer. Mater. 2, 586 (1987).Google Scholar
3 Larbalestier, D. C., Daeumling, M., Cai, X., Sauntjens, J., McKinnell, J., Hampshire, D., Lee, P., Meingast, C., Willis, T., Muller, H., Ray, R. D., Dillenburg, R. G., Helistrom, E. E., and Joynt, R., J. Appl. Phys. 62, 3308 (1987).Google Scholar
4 Togano, K., Kumakura, H., and Dietderich, D. R., Cryogenics, Vol. 29, March supplement, 286 (1989).Google Scholar
5 Shi, D., Tang, M., Vandervoort, K., and Claus, H., Phys. Rev. B 39, 9091 (1989).Google Scholar
6 Shi, D., Tang, M., Boley, M. S., Hash, M., Vandervoort, K., Claus, H., and Lwin, Y. N., Phys. Rev. B 40, 2247 (1989).Google Scholar