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Controlled Carbon Nanotube Networks and its Corresponding Channel Effect at High Bias

Published online by Cambridge University Press:  01 February 2011

Jun Huang ,
Bangalore Kiran Rao ,
Harindra Vedala ,
Do-Hyun Kim ,
Minhyon Jeon ,
Wanjun Park  and
Wonbong Choi
Jun Huang
Affiliation:
[email protected], Florida International University, Mechanical and Materials Engineering, 10555 West Flagler Street, Miami, FL, 33174, United States, 3053481343, 3053481932
Bangalore Kiran Rao
Affiliation:
[email protected], Florida International University, Mechanical and Materials Engineering, 10555 West Flagler Street, Miami, FL, 33174, United States
Harindra Vedala
Affiliation:
[email protected], Florida International University, Mechanical and Materials Engineering, 10555 West Flagler Street, Miami, FL, 33174, United States
Do-Hyun Kim
Affiliation:
[email protected], Florida International University, Mechanical and Materials Engineering, 10555 West Flagler Street, Miami, FL, 33174, United States
Minhyon Jeon
Affiliation:
[email protected], Inje University, School of Nanoengineering, Gimhae, 621749, Korea, Republic of
Wanjun Park
Affiliation:
[email protected], SAMSUNG SAIT, Samsung Advanced Institute of Technology, Gihueng-Eup Young-Si Gyeonggi-Do, Gyeonggi, 449-712, Korea, Republic of
Wonbong Choi
Affiliation:
[email protected], Florida International University, Mechanical and Materials Engineering, 10555 West Flagler Street, Miami, FL, 33174, United States
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Abstract

Geometrically controlled single-walled carbon nanotube (SWNT) and multi-walled carbon nanotube (MWNT) networks were fabricated by a width confinement technique to characterize their electrical characteristics. The results demonstrated non-linear resistance decay with the number of conducting channels. The current-voltage characteristics at high field were studied until the electrical breakdown took place. Large current (∼2 mA), low resistance (∼5 KΩ) and current densities exceeding ∼108 A/cm2 were demonstrated from multi-channel MWNT networks confined in a 10 μm × 15 μm trench. Additionally, chronological SEM imaging was used to identify the breakdown sequences in the carbon nanotube networks, which revealed a strong tendency for CNT breakdown to occur in the vicinity of CNT-CNT intersections. Our results offer insights for interconnect applications using CNT networks.

Keywords

nanoscaleelectrical propertiesmicroelectronics
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 963: Symposium Q – Nanowires and Carbon Nanotubes – Science and Applications , 2006 , 0963-Q10-51
Copyright
Copyright © Materials Research Society 2007

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References

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