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Characteristics of Organic Memory Using Metal Oxide Nano-clusters

Published online by Cambridge University Press:  01 February 2011

You-Wei Cheng
Affiliation:
[email protected], National Chiao Tung University, Department of Photonics & Display Institute, Hsinchu, Taiwan, Province of China
Tzu-Yueh Chang
Affiliation:
[email protected], National Chiao Tung University, Department of Photonics & Institute of Electro-Optical Engineering, hsinchu, Taiwan, Province of China
Po-Tsung Lee
Affiliation:
[email protected], National Chiao Tung University, Department of Photonics & Institute of Electro-Optical Engineering, hsinchu, Taiwan, Province of China
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Abstract

In this report, electrical properties of an organic memory device with a tri-layer structure, MoO3 nano-clusters layer sandwiched between Alq3 thin films, are investigated. The device using this kind of structure exhibits a large ON/OFF density current ratio over 104, long retention time over 1hr, and an electrically programmable character. The formation of the bistable resistance switching of the device originates from a charge trapping effect of the MoO3 nano-clusters layer. Moreover, current density-voltage (J-V) characteristics of the device are quite different from those of OBDs using MoO3 nano-particles. No negative differential resistance is observed in the J-V curve of the device. This may be due to the distinct surface morphology of the MoO3 layer on the Alq3 thin film.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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