Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-24T17:34:06.207Z Has data issue: false hasContentIssue false

Brillouin and Raman Scattering Studies on the Relaxor Ferroelectric 0.71Pb(Ni1/3Nb2/3)O3-0.29PbTiO3 Single Crystal

Published online by Cambridge University Press:  26 February 2011

Shinya Tsukada
Affiliation:
[email protected], University of Tsukuba, Graduate School of Pure and Applied Sciences, 1-1-1 Tennodai, Tsukuba, 305-8571, Japan, +81-29-853-5262, +81-29-853-5262
Yuji Ike
Affiliation:
[email protected], University of Tsukuba, Graduate School of Pure and Applied Sciences, 1-1-1 Tennodai, Tsukuba, 305-8571, Japan
Jun Kano
Affiliation:
[email protected], University of Tsukuba, Graduate School of Pure and Applied Sciences, 1-1-1 Tennodai, Tsukuba, 305-8571, Japan
Ruiping Wang
Affiliation:
[email protected], AIST, 1-1-1 Umezono, Tsukuba, 305-8564, Japan
Yoshiro Shimojo
Affiliation:
[email protected], AIST, 1-1-1 Umezono, Tsukuba, 305-8564, Japan
Tadashi Sekiya
Affiliation:
[email protected], AIST, 1-1-1 Umezono, Tsukuba, 305-8564, Japan
Seiji Kojima
Affiliation:
[email protected], University of Tsukuba, Graduate School of Pure and Applied Sciences, 1-1-1 Tennodai, Tsukuba, 305-8571, Japan
Get access

Abstract

Brillouin and Raman spectra of a 0.71Pb(Ni1/3Nb2/3)O3-0.29PbTiO3 single crystal were measured in two light scattering geometries to elucidate the origins of central peaks that is related to the dynamics of the polar nanoregions. Two Lorentzian-type central peaks exist in the Brillouin spectra. The shape and the full width at half maximum of the broader peak in Brillouin spectra are almost same as that observed in Raman spectra. This indicates that two relaxations occur in the polar nanoregions. These two processes might be originated from the different switching directions of polarization.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Smolensky, G. A., J. Phys. Soc. Jpn. 28, 26 (1970).Google Scholar
[2] Park, S.-E. and Shrout, T. R., J. Appl. Phys. 82, 1804 (1997).Google Scholar
[3] Ye, Z.-G., Key Eng. Mat. 155, 81 (1998).Google Scholar
[4] Bokov, A. A. and Ye, Z.-G., J. Mater. Sci. 41, 31 (2006).Google Scholar
[5] Cross, L. E., Ferroelectrics 76, 305 (1987).Google Scholar
[6] Kleemann, W., Int. J. Mod. Phys. B 13, 2469 (1993).Google Scholar
[7] Viehland, D., Jang, S. and Cross, L. E., J. Appl. Phys. 68 2916 (1990).Google Scholar
[8] Burns, G. and Dacol, F. H., Solid State Commun. 48, 853 (1983).Google Scholar
[9] Yao, X., Chen, Z. L. and Cross, L. E., J. Appl. Phys. 54, 3399 (1997)Google Scholar
[10] Tsukada, S., Ike, Y., Kano, J., Sekiya, T., Shimojo, Y., Wang, R. and Kojima, S., Ferroelectrics, to be published.Google Scholar
[11] Ko, J.-H., Kim, D. H., Kojima, S., Chen, W. and Ye, Z.-G., J. Appl. Phys. 100, 66106 (2006)Google Scholar
[12] Toulous, J., DiAntonio, P., Vumeister, B. E., Wang, X. M. and Knauss, L. A., Phys. Rev. Lett. 68, 232 (1992).Google Scholar
[13] Vakrushev, S., Zhukov, S., Fetisov, G. and Chernyshov, V., J. Phys.: Condens. Matter 6, 4021 (1994)Google Scholar
[14] Kim, D. H., Ko, J.-H., Feng, C. D. and Kojima, S., J. Appl. Phys. 98, 044106 (2005).Google Scholar
[15] Jang, F. M. and Kojima, S., Phys., Rev. B 62, 8572 (2000).Google Scholar
[16] Fan, J., Kuok, M. H., Ng, S. C., Yasuda, N. and Ohwa, H., Orihara, H., Iwata, H. M. and Ishibashi, Y., J. Appl. Phys. 91, 2262 (2002).Google Scholar
[17] Gorouya, Y., Tsujimi, Y., Iwata, M. and Yagi, T., Appl. Phys. Lett. 83, 1358 (2003).Google Scholar
[18] Nakata, Y., Tsujimi, Y., Katsuraya, K., Iwata, M. and Yagi, T., Appl. Phys. Lett. 89, 22903 (2006).Google Scholar
[19] Tsukada, S., Ike, Y., Kano, J., Sekiya, T., Shimojo, Y., Wang, R. and Kojima, S., Appl. Phys. Lett. 89, 212903 (2006).Google Scholar
[20] Lushnikov, S. G., Jang, F. M. and Kojima, S., Solid State Commun. 122, 129 (2002).Google Scholar
[21] Svitelskiy, O., Toulous, J., Yong, G. and Ye, Z.-G., Phys. Rev. B 68, 104107 (2003).Google Scholar
[22] Kusumoto, K. and Sekiya, T., Ferroelectrics 240, 327 (2000).Google Scholar
[23] Lei, C., Chen, K., Zhang, X. and Wang, J., Solid State Commun. 123, 445 (2002).Google Scholar
[24] Toulous, J., Jang, F., Svitelskiy, O., Chen, W. and Ye, Z.-G., Phys. Rev. B 72, 184106 (2005).Google Scholar
[25] Wada, S., Suzuki, S., Noma, T., Suzuki, T., Osada, M., Kakihana, M., Park, S.-E., Gross, L. E. and Shrout, T. R., J. Appl. Phys. 38, 5505 (1999).Google Scholar
[26] Husson, E., Abello, L. and Morell, A., Mater. Res. Bull. 25, 539 (1990).Google Scholar