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Blue Light Emission from Germanium Ultrafine Particles by the Gas Evaporation Technique

Published online by Cambridge University Press:  28 February 2011

Shinji Nozaki ,
S. Sato ,
A. Denda ,
H. Ono  and
H. Morisaki
Shinji Nozaki
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
S. Sato
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
A. Denda
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
H. Ono
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
H. Morisaki
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
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Abstract

The ultrafine particles with diameters in the order of 10 nm were deposited onto Si and SiO2 substrates by evaporation of Ge in a pure hydrogen atmosphere. Although the as-deposited Ge ultrafine particles do not show any detectable luminescence, they emit blue light after being exposed to the UV light for a long time. The blue light is strong enough to be seen with the naked eye even under a room light. The photooxidation, unique to the Ge ultrafine particles, has been identified as a major factor contributing to the blue light emission.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 358: Symposium F – Microcrystalline and Nanocrystalline Semiconductors , 1994 , 133
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1 Canham, L. T., Appl. Phys. Lett. 57, 1046 (1990).Google Scholar
2 Osaka, Y., Tsunemoto, K., Toyomura, F., Myoren, H. and Kohno, K., Jpn. J. Appl. Phys. 31, L365 (1992)Google Scholar
3 Morisaki, H., Ping, F. W.. Ono, H. and Yazawa, K., J. Appl. Phys. 70, 1869 (1991).Google Scholar
4 Nozaki, S., Sato, S., Ono, H. and Morisaki, H., Mat. Res. Soc. Symp. Proc. 351, 399 (1994).Google Scholar
5 Moulder, J. F., Stickle, W. F., Sobol, P. E. and Bomben, K. D., Handbook of X-Ray Photoelectron Spectroscopy, edited by Chastain, J. (Perkin-Elmer Corp., MN, 1992) p. 223.Google Scholar
6 Harshavardhan, K. S. and Hedge, M. S., Solid State Commun. 69, 117 (1989).Google Scholar
7 Maeda, Y., Tsukamoto, N., Yazawa, Y., Kanemitsu, Y. and Masumoto, Y., Appl. Phys. Lett. 59, 3168 (1991).Google Scholar