Hostname: page-component-745bb68f8f-grxwn Total loading time: 0 Render date: 2025-01-12T04:02:49.111Z Has data issue: false hasContentIssue false
  • English
  • Français

Annealing Effects on Deuterium in a-Si:D.

Published online by Cambridge University Press:  28 February 2011

V. P. Bork ,
P. A. Fedders ,
D. J. Leopold ,
R. E. Norberg ,
J. B. Boycea  and
J. C. Knights
V. P. Bork
Affiliation:
Washington University, St. Louis, Missouri 63130
P. A. Fedders
Affiliation:
Washington University, St. Louis, Missouri 63130
D. J. Leopold
Affiliation:
Washington University, St. Louis, Missouri 63130
R. E. Norberg
Affiliation:
Washington University, St. Louis, Missouri 63130
J. B. Boycea
Affiliation:
Xerox PARC, Palo Alto, California 94304
J. C. Knights
Affiliation:
Xerox PARC, Palo Alto, California 94304
Get access

Abstract

Progressive annealing of a-Si:D and a-Si:DH samples between 250 and 600°C is found to eliminate the broad central deuteron magnetic resonance (DMR) spectral component associated with weakly bonded D. The well-resolved doublet arising from tightly bound D diminishes in intensity. The narrow central line associated with microvoid-contained molecular D2 and HD increases and then decreases for the warmest anneals. DMR relaxation times, line shapes, and hole-burning spectra reflect changes in sample morphology upon annealing.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 70: Symposium E – Materials Issues in Amorphous-Semiconductor Technology , 1986 , 89
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Leopold, D. J., Fedders, P. A., Norberg, R. E., Boyce, J. B., and Knights, J. C., Phys. Rev. B 31, 5642 (1985).CrossRefGoogle Scholar
2. Fedders, P. A., Fisch, R., and Norberg, R. E., Phys. Rev. B 31, 6887 (1985).CrossRefGoogle Scholar