Published online by Cambridge University Press: 10 February 2011
To quantify the mechanical properties and deformation behaviour of sub-micron wires, an in-situ nanoindenter system is being developed for a TEM. The miniaturized displacement controlled nanoindenter fits inside a side entry specimen holder. For coarse positioning, a novel 3-axis inertial positioner has been developed. This positioner has a range of 5mm with a 300 nm resolution. The fine displacements are generated by means of a tube piezo and the force is measured using a fibre optic interferometer.