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12.1” Svga Wide Viewing Angle Tft-Lcds Based on Ridge and Fringe-Field Structures

Published online by Cambridge University Press:  10 February 2011

A. Lien ,
C. Cai ,
R. A. John ,
E. Galligan ,
R. Nunes ,
J. Wilson  and
H. Ifill
A. Lien
Affiliation:
IBM T. J. Watson Research Center P.O. Box 218, Yorktown Heights, NY 10598
C. Cai
Affiliation:
IBM T. J. Watson Research Center P.O. Box 218, Yorktown Heights, NY 10598
R. A. John
Affiliation:
IBM T. J. Watson Research Center P.O. Box 218, Yorktown Heights, NY 10598
E. Galligan
Affiliation:
IBM T. J. Watson Research Center P.O. Box 218, Yorktown Heights, NY 10598
R. Nunes
Affiliation:
IBM T. J. Watson Research Center P.O. Box 218, Yorktown Heights, NY 10598
J. Wilson
Affiliation:
IBM T. J. Watson Research Center P.O. Box 218, Yorktown Heights, NY 10598
H. Ifill
Affiliation:
IBM T. J. Watson Research Center P.O. Box 218, Yorktown Heights, NY 10598
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Abstract

We have recently proposed the ridge and fringe-field multi-domain homeotropic (RFF-MH) mode for improving viewing angles of thin-film-transistor driven liquid crystal display (TFT-LCD) panels (4). We also demonstrated that the RFF-MH structures are suitable for high resolution desk top TFT-LCD panels (5). In this paper we demonstrated that the RFF-MH method is also suitable for the high-end large-area notebook application since it provides wide viewing angles with a high optical transmission. The ridge structure is constructed on top of the indium tin oxide (ITO) layer of the color filter (CF) substrate, and can be fabricated during the color filter process. The cell process of the RFF-MH panel is compatible to the conventional TFT-LCD cell fabrication process. It requires one extra photolithographic step; however no rubbing treatment is required.

Keywords

multi-domainwide viewing anglevertical alignmenthomeotropic alignmentliquid crystal display
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 559: Symposium D – Liquid Crystals Materials and Devices , 1999 , 275
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

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