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Ultrafast Dynamics of Laser-Excited Solids

Published online by Cambridge University Press:  31 January 2011

D.A. Reis ,
K.J. Gaffney ,
G.H. Gilmer  and
B. Torralva
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Abstract

We discuss recent experimental and theoretical results on ultrafast materials dynamics. Intense, femtosecond lasers can deposit energy in a time that is short compared with relaxation processes and can generate extremely large carrier densities that drive bond softening, nonthermal melting, and ablation. In particular, we present optical experiments on electronic softening of coherent phonons in bismuth and x-ray experiments on ultrafast disordering in indium antimonide that probe the bonding of the lattice under successively higher carrier concentrations. We review a number of molecular dynamics simulations and their assumptions, which address nonthermal melting. Large-scale molecular dynamics simulations elucidate the role of void formation in laser ablation.

Keywords

laser ablationsimulation
Type
Research Article
Information
MRS Bulletin , Volume 31 , Issue 8: Ultrafast Lasers in Materials Research , August 2006 , pp. 601 - 606
Copyright
Copyright © Materials Research Society 2006

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References

1Liu, X.Du, D. and Mourou, G.IEEE J. Quantum Electron. 33 (1997) p. 1706.CrossRefGoogle Scholar
2Merlin, R.Solid State Commun. 102 (1997) p. 207.CrossRefGoogle Scholar
3Thomsen, C.Grahn, H.T.Maris, H.J. and Tauc, J.Phys. Rev. B 34 (1986) p. 4129.CrossRefGoogle Scholar
4Hunsche, S.Wienecke, K.Dekorsy, T. and Kurz, H.Phys. Rev. Lett. 75 (1995) p. 1815.CrossRefGoogle Scholar
5DeCamp, M.F.Reis, D.A.Bucksbaum, P.H. and Merlin, R.Phys. Rev. B. 64 (2001) p. 92301.CrossRefGoogle Scholar
6Young, J.F. and Driel, H.M. van, Phys. Rev. B 26 (1982) p. 2147.CrossRefGoogle Scholar
7Shank, C.V.Yen, R. and Hirlimann, C.Phys. Rev. Lett. 50 (1983) p. 454.CrossRefGoogle Scholar
8Sokolowski-Tinten, K., Bialkowski, J.Cavalleri, A.Linde, D. von der, Oparin, A.Meyer-ter-Vehn, J., and Anisimov, S.I.Phys. Rev. Lett. 81 (1998) p. 224.CrossRefGoogle Scholar
9Murray, É.D.Fritz, D.M.Wahlstrand, J.K.Fahy, S. and Reis, D.A.Phys. Rev. B 72 060301 (2005).CrossRefGoogle Scholar
10Lindenberg, A.M.Larsson, J.Sokolowski-Tinten, K., Gaffney, K.J.Blome, C.Synnergren, O.Sheppard, J.Caleman, C.MacPhee, A.G.Weinstein, D.Lowney, D.P.Allison, T.K.Matthews, T.Falcone, R.W.Cavalieri, A.L.Fritz, D.M.Lee, S.H.Bucksbaum, P.H.Reis, D.A.Rudati, J.Fuoss, P.H.Kao, C.C.Siddons, D.P.Pahl, R.Als-Nielsen, J., Duesterer, S.Ischebeck, R.Schlarb, H.Schulte-Schrepping, H., Tschentscher, T.Schneider, J.Linde, D. von der, Hignette, O.Sette, F.Chapman, H.N.Lee, R.W.Hansen, T.N.Techert, S.Wark, J.S.Bergh, M.Huldt, G.Spoel, D. van der, Timneanu, N.Hajdu, J.Akre, R.A.Bong, E.Krejcik, P.Arthur, J.Brennan, S.Luening, K. and Hastings, J.B.Science 308 (2005) p. 392.CrossRefGoogle Scholar
11Gaffney, K.J.Lindenberg, A.M.Larsson, J.Sokolowski-Tinten, K., Blome, C.Synnergren, O.Sheppard, J.Caleman, C.MacPhee, A.G.Weinstein, D.Lowney, D.P.Allison, T.Matthews, T.Falcone, R.W.Cavalieri, A.L.Fritz, D.M.Lee, S.H.Bucksbaum, P.H.Reis, D.A.Rudati, J.Macrander, A.T.Fuoss, P.H.Kao, C.C.Siddons, D.P.Pahl, R.Moffat, K.Als-Nielsen, J., Duesterer, S.Ischebeck, R.Schlarb, H.Schulte-Schrepping, H., Schneider, J.Linde, D. von der, Hignette, O.Sette, F.Chapman, H.N.Lee, R.W.Hansen, T.N.Wark, J.S.Bergh, M.Huldt, G.Spoel, D. van der, Timneanu, N.Hajdu, J.Akre, R.A.Bong, E.Krejcik, P.Arthur, J.Brennan, S.Luening, K. and Hastings, J.B.Phys. Rev. Lett. 95 125701 (2005).CrossRefGoogle Scholar
12Reis, D.A. and Lindenberg, A.M. in Light Scattering in Solids IX, edited by Cardona, M. and Merlin, R. (Springer, Berlin, 2006).Google Scholar
13Cheng, T.K.Brorson, S.D.Kazeroonian, A.S.Moodera, J.S.Dresselhaus, G.Dresselhaus, M.S. and Ippen, E.P.Appl. Phys. Lett. 57 (1990) p. 1004.CrossRefGoogle Scholar
14Cheng, T.K.Vidal, J.Zeiger, M.J.Dresselhaus, G.Dresselhaus, M.S. and Ippen, E.P.Appl. Phys. Lett. 59 (1991) p. 1923.CrossRefGoogle Scholar
15Stevens, T.E.Kuhl, J. and Merlin, R.Phys. Rev. B 65 144304 (2002).CrossRefGoogle Scholar
16Hase, M.Mizoguchi, K.Harima, H.Nakashima, S.Tani, M.Sakai, K. and Hangyo, M.Appl. Phys. Lett. 69 (1996) p. 2474.CrossRefGoogle Scholar
17Hase, M.Mizoguchi, K.Harima, H.Nakashima, S.I. and Sakai, K.Phys. Rev. B 58 (1998) p. 5448.CrossRefGoogle Scholar
18Hase, M.Kitajima, M.Nakashima, S. and Mizoguchi, K.Phys. Rev. Lett. 88 (2002) p. 67401.CrossRefGoogle Scholar
19Fahy, S. and Reis, D.A.Phys. Rev. Lett. 93 109701 (2004).CrossRefGoogle Scholar
20Hase, M.Kitajima, M.Nakashima, S. and Mizoguchi, K.Phys. Rev. Lett. 93 109702 (2004).CrossRefGoogle Scholar
21Sokolowski-Tinten, K., Blome, C.Blums, J.Cavalleri, A.Hoegen, M. Horn von, and Linde, D. von der, Nature 422 (2003) p. 287.CrossRefGoogle Scholar
22Stampfli, P. and Bennemann, K.H.Phys. Rev. B 49 (1994) p. 7299.CrossRefGoogle Scholar
23Rousse, A.Rischel, C.Fourmaux, S.Uschmann, I.Sebban, S.Grillon, G. PBalcou, h.Förster, E., Geindre, J.P.Audebert, P.Gauthier, J.C. and Hulin, D.Nature 410 (2001) p. 65.CrossRefGoogle Scholar
24Sokolowski-Tinten, K., Blome, C.Dietrich, C.Tarasevitch, A.Hoegen, M. Horn von, Linde, D. von der, Cavalleri, A.Squier, J. and Kammler, M.Phys. Rev. Lett. 87 225701 (2001).CrossRefGoogle Scholar
25Sundaram, S.K. and Mazur, E.Nature Mater. 1 (2002) p. 217.CrossRefGoogle Scholar
26Biswas, R. and Ambegaokar, V.Phys. Rev. B 26 (1982) p. 1980.CrossRefGoogle Scholar
27Dumitrica, T.Burzo, A.Dou, Y. and Allen, R.E.Phys. Stat. Sol. B 241 (2004) p. 2331.CrossRefGoogle Scholar
28Emma, P.Iverson, R.Krejcik, P.Raimondi, P. and Safrarek, J.Particle Accelerator Conf. Proc., Vol. 5 (2001) p. 4038.Google Scholar
29Cavalieri, A.L.Fritz, D.M.Lee, S.H.Bucksbaum, P.H.Reis, D.A.Rudati, J.Mills, D.M.Fuoss, P.H.Stephenson, G.B.Kao, C.C.Siddons, D.P.Lowney, D.P.MacPhee, A.G.Weinstein, D.Falcone, R.W.Pahl, R.Als-Nielsen, J., Blome, C.Düsterer, S., Ischebeck, R.Schlarb, H.Schulte-Schrepping, H., Tschentscher, Th.Schneider, J.Hignette, O.Sette, F.Sokolowski-Tinten, K., Chapman, H.N.Lee, R.W.Hansen, T.N.Synnergren, O.Larsson, J.Techert, S.Sheppard, J.Wark, J.S.Bergh, M.Caleman, C.Huldt, G.Spoel, D. van der, Timneanu, N.Hajdu, J.Akre, R.A.Bong, E.Emma, P.Krejcik, P.Arthur, J.Brennan, S.Gaffney, K.J.Lindenberg, A.M.Luening, K. and Hastings, J.B.Phys. Rev. Lett. 94 114801 (2005).CrossRefGoogle Scholar
30Harp, G.D. and Berne, B.J.Phys. Rev. A 2 (1970) p. 975.CrossRefGoogle Scholar
31Hase, M.Kitajima, M.Constantinescu, A.M. and Petek, H.Nature 426 (2003) p. 51.CrossRefGoogle Scholar
32Axt, V.M. and Kuhn, T.Rep. Prog. Phys. 67 (2004) p. 433.CrossRefGoogle Scholar
33Glezer, E.N.Siegel, Y.Huang, L. and Mazur, E.Phys. Rev. B 51 (1994) p. 9589.CrossRefGoogle Scholar
34Heine, V. and Vechten, J.A. Van, Phys. Rev. B 13 (1976) p. 1622.CrossRefGoogle Scholar
35Combescot, M. and Bok, J.Phys. Rev. Lett. 48 (1982) p. 1413.CrossRefGoogle Scholar
36Silvestrelli, P.L.Alavi, A.Parrinello, M. and Frenkel, D.Phys. Rev. Lett. 77 (1996) p. 3149.CrossRefGoogle Scholar
37Lindenberg, A.M.Kang, I.Johnson, S.L.Missalla, T.Heimann, P.A.Chang, Z.Larsson, J.Bucksbaum, P.H.Kapteyn, H.C.Padmore, H.A.Lee, R.W.Wark, J.S. and Falcone, R.W.Phys. Rev. Lett. 84 (2000) p. 111.CrossRefGoogle Scholar
38Allen, R.E.Phys. Rev. B 50 (1994) p. 18629.CrossRefGoogle Scholar
39Graves, J.S. and Allen, R.E.Phys. Rev. B 58 (1998) p. 13627.CrossRefGoogle Scholar
40Allen, R.E.Dumitrica, T. and Torralva, B. in Ultrafast Physical Processes in Semiconductors, edited by Tsen, K.T. (Academic, New York, 2000).Google Scholar
41Dou, Y.Torralva, B. and Allen, R.E.J. Mod. Optics 50 (2003) p. 2615.Google Scholar
42Torralva, B.Niehaus, T.A.Elstner, M.Suhai, S.Frauenheim, Th. and Allen, R.E.Phys. Rev. B 64 153105 (2001).CrossRefGoogle Scholar
43Zhigilei, L.V.Ivanov, D.S.Leveugle, E.Sadigh, B.Bringa, E.M.Proc. SPIE 5448 (2004) p. 505.CrossRefGoogle Scholar
44Siwick, B.J.Dwyer, J.R.Jordan, R.E. and Miller, R.I.D.Science 302 (2003) p. 1382.CrossRefGoogle Scholar
45Anisimov, S.I.Inogamov, N.A.Oparin, A.M.Rethfeld, B.Yabe, T.Ogawa, M. and Fortov, V.E.Appl. Phys. A 69 (1999) p. 617.CrossRefGoogle Scholar
46Zhakhovskii, V.V.Nishihara, S.I.Anisimov, K. and Inogamov, N.A.JETP Lett. 71 (2000) p. 167.CrossRefGoogle Scholar
47Anisimov, S.I.Zhakhovskii, V.V.Inogamov, N.A.Nishihara, K.Oparin, A.M, and Petrov, Y.V.JETP Lett. 77 (2003) p. 606.CrossRefGoogle Scholar
48Linde, D. von der, Sokolowski-Tinten, K., and Bialkowski, J.Appl. Surf. Sci. 110 (1997) p. 1.CrossRefGoogle Scholar
49Schafer, C.Urbassek, H.M. and Zhigilei, L.V.Phys. Rev. B 66 115404 (2002).CrossRefGoogle Scholar
50Zhigilei, L.V. and Garrison, B.J.Appl. Surf. Sci. 129 (1998) p. 142.CrossRefGoogle Scholar
51Zhigilei, L.V. and Garrison, B.J.Appl. Phys. Lett. 71 (1997) p. 551.CrossRefGoogle Scholar
52Herrmann, R.F.W.Gerlach, J. and Campbell, E.E.B.Appl. Phys. A 66 (1998) p. 35.CrossRefGoogle Scholar
53Zhigilei, L.V. and Garrison, B.J.Appl. Phys. Lett. 74 (1999) p. 1341.CrossRefGoogle Scholar
54Komashko, A.M.Feit, M.D.Rubenchik, A.M.Perry, M.D.Banks, P.S.., Appl. Phys. A 69 (1999) p. S95.CrossRefGoogle Scholar
55Zhou, X.W.Wadley, H.N.G.Johnson, R.A.Larson, D.J.Tabat, N.Cerezo, A.Petford-Long, A.K., Smith, G.D.W.Clifton, P.H.Martens, R.L. and Kelly, T.F.Acta Mater. 49 (2001) p. 4005.CrossRefGoogle Scholar
56Cornacchia, M.Arthur, J.Bane, K.Bolton, P.Carr, R.Decker, F.J.Emma, P.Galayda, J.Hastings, J.Hodgson, K.Huang, Z.Lindau, I.Nuhn, H.D.Paterson, J.M.Pellegrini, C.Reiche, S.Schlarb, H.Stöhr, J., Stupakov, G.Walz, D. and Winick, H.J. Synch. Rad. 11 (2004) p. 227.CrossRefGoogle Scholar