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Tribology in Full View

Published online by Cambridge University Press:  31 January 2011

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Abstract

For many years, a fundamental problem in contact mechanics, both tribology and indentation problems, has been the inability to see what is taking place—the buried-interface problem. Over the past few years, there have been developments whereby it has become possible to perform contact mechanics experiments in situ within a transmission electron microscope. These new experiments have been enabled by both the miniaturization of sensors and actuators and improvements in their mechanical stability and force sensitivity. New information is now becoming available about the nanoscale processes of sliding, wear, and tribochemical reactions, as well as microstructural evolution during nanoindentation such as dislocation bursts and phase transformations. This article provides an overview of some of these developments, in terms of both the advances in technical instrumentation and some of the novel scientific insights.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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References

1.Binnig, G., Quate, C.F., Gerber, C., Phys. Rev. Lett. 56, 930 (1986).CrossRefGoogle Scholar
2.Mate, C.M., McClelland, G.M., Erlandsson, R., Chiang, S., Phys. Rev. Lett. 59, 1942 (1987).CrossRefGoogle Scholar
3.Krim, J., Solina, D.H., Chiarello, R., Phys. Rev. Lett. 66, 181 (1991).CrossRefGoogle Scholar
4.Watts, E.T., Krim, J., Widom, A., Phys. Rev. B 41, 3466 (1990).CrossRefGoogle Scholar
5.Tabor, D., Winterto, Rh., Proc. R. Soc. London, Ser. A 312, 435 (1969).Google Scholar
6.Scharf, T.W., Singer, I.L., Tribol. Lett. 14, 3 (2003).CrossRefGoogle Scholar
7.McDevitt, N.T., Donley, M.S., Zabinski, J.S., Wear 166, 65 (1993).CrossRefGoogle Scholar
8.Cann, P.M., Spikes, H.A., Tribol. Trans. 34, 248 (1991).CrossRefGoogle Scholar
9.Scharf, T.W., Singer, I.L., Tribol. Lett. 14, 137 (2003).CrossRefGoogle Scholar
10.Jean-Michel, M., Hong, L., Thiery Le, M., Maryline, M., Tribol. Lett. 14, 25 (2003).Google Scholar
11.de la Figuera, J., Pohl, K., de la Fuente, O.R., Schmid, A.K., Bartelt, N.C., Carter, C.B., Hwang, R.Q., Phys. Rev. Lett. 86, 3819 (2001).CrossRefGoogle Scholar
12.Gane, N., Proc. R. Soc. London, Ser. A 317, 367 (1970).Google Scholar
13.Gane, N., Bowden, F.P., J. Appl. Phys. 39, 1432 (1968).CrossRefGoogle Scholar
14.Kuwabara, M., Lo, W., Spence, J.C.H., J. Vac. Sci. Technol. A 7, 2745 (1989).CrossRefGoogle Scholar
15.Lo, W.K., Spence, J.C.H., Ultramicroscopy 48, 433 (1993).CrossRefGoogle Scholar
16.Spence, J.C.H., Lo, W., Kuwabara, M., Ultramicroscopy 33, 69 (1990).CrossRefGoogle Scholar
17.Spence, J.C.H., Ultramicroscopy 25, 165 (1988).CrossRefGoogle Scholar
18.Lutwyche, M.I., Wada, Y., Sens. Actuators A 48, 127 (1995).CrossRefGoogle Scholar
19.Lutwyche, M.I., Wada, Y., Appl. Phys. Lett. 66, 2807 (1995).CrossRefGoogle Scholar
20.Naitoh, Y., Takayanagi, K., Tomitori, M., Surf. Sci. 357, 208 (1996).CrossRefGoogle Scholar
21.Kizuka, T., Tanaka, N., Deguchi, S., Naruse, M., Microsc. Microanal. 4, 218 (1998).CrossRefGoogle Scholar
22.Kizuka, T., Yamada, K., Deguchi, S., Naruse, M., Tanaka, N., J. Electron Microsc. 46, 151 (1997).CrossRefGoogle Scholar
23.Kizuka, T., Yamada, K., Deguchi, S., Naruse, M., Tanaka, N., Phys. Rev. B 55, R7398 (1997).CrossRefGoogle Scholar
24.Ohnishi, H., Kondo, Y., Takayanagi, K., Nature 395, 780 (1998).CrossRefGoogle Scholar
25.Ohnishi, H., Kondo, Y., Takayanagi, K., Surf. Sci. 415, L1061 (1998).CrossRefGoogle Scholar
26.Svensson, K., Jompol, Y., Olin, H., Olsson, E., Rev. Sci. Instrum. 74, 4945 (2003).CrossRefGoogle Scholar
27.Erts, D., Lõhmus, A., Lõhmus, R., Olin, H., Appl. Phys. A 72(Suppl.), S71 (2001).CrossRefGoogle Scholar
28.Erts, D., Lõhmus, A., Lõhmus, R., Olin, H., Pokropivny, A.V., Ryen, L., Svensson, K., Appl. Surf. Sci. 188, 460 (2002).CrossRefGoogle Scholar
29.Kizuka, T., Ohmi, H., Sumi, T., Kumazawa, K., Deguchi, S., Naruse, M., Fujisawa, S., Sasaki, S., Yabe, A., Enomoto, Y., Jpn. J. Appl. Phys. 40, L170 (2001).CrossRefGoogle Scholar
30.Kuzumaki, T., Mitsuda, Y., Jpn. J. Appl. Phys. 45, 364 (2006).CrossRefGoogle Scholar
31.Nakajima, M., Arai, F., Fukuda, T., IEEE Trans. Nanotechnol. 5, 243 (2006).CrossRefGoogle Scholar
32.Nafari, A., Karlen, D., Rusu, C., Svensson, K., Olin, H., Enoksson, P., Proceedings of the 20th IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2007), January 21–25, 2007, Kobe, Japan, pp. 103106.CrossRefGoogle Scholar
33.Minor, A.M., Morris, J.W. Jr., Stach, E.A., Appl. Phys. Lett. 79, 1625 (2001).CrossRefGoogle Scholar
34.Bobji, M.S., Pethica, J.B., Inkson, B.J., J. Mater. Res. 20, 2726 (2005).CrossRefGoogle Scholar
35.Bobji, M.S., Ramanujan, C.S., Pethica, J.B., Inkson, B.J., Meas. Sci. Technol. 17, 1324 (2006).CrossRefGoogle Scholar
36.Nafari, A., Danilov, A., Rödjegärd, H., Enoksson, P., Olin, H., Sens. Actuators A 123–124, 44 (2005).CrossRefGoogle Scholar
37.Rzepiejewska-Malyska, K.A., Buerki, G., Michler, J., Major, R.C., Cyrankowski, E., Syed Asif, S.A., Warren, O.L., J. Mater. Res. 23, 1973 (2008).CrossRefGoogle Scholar
38.Merkle, A., Marks, L.D., Wear 265, 18641869 (2008).CrossRefGoogle Scholar
39.Merkle, A.P., Marks, L.D., Appl. Phys. Lett. 90, 064101 (2007).CrossRefGoogle Scholar
40.Dienwiebel, M., Pradeep, N., Verhoeven, G.S., Zandbergen, H.W., Frenken, J.W.M., Surf. Sci. 576, 197 (2005).CrossRefGoogle Scholar
41.Dienwiebel, M., Verhoeven, G.S., Pradeep, N., Frenken, J.W.M., Heimberg, J.A., Zandbergen, H.W., Phys. Rev. Lett. 92, 126101 (2004).CrossRefGoogle Scholar
42.Merkle, A.P., Marks, L.D., Tribol. Lett. 26, 73 (2007).CrossRefGoogle Scholar
43.Merkle, A.P., Marks, L.D., Philos. Mag. Lett. 87, 527 (2007).CrossRefGoogle Scholar
44.Stach, E.A., Freeman, T., Minor, A.M., Owen, D.K., Cumings, J., Wall, M.A., Chraska, T., Hull, R., Morris, J.W. Jr., Zettl, A., Dahmen, U., Microsc. Microanal. 7, 507 (2001).CrossRefGoogle Scholar
45.Minor, A.M., Syed Asif, S.A., Shan, Z.W., Stach, E.A., Cyrankowski, E., Wyrobek, T.J., Warren, O.L., Nat. Mater. 5, 697 (2006).CrossRefGoogle Scholar
46.Soer, W.A., De Hosson, J.Th.M., Minor, A.M., Shan, Z.W., Syed Asif, S.A., Warren, O.L., Appl. Phys. Lett. 90, 181924 (2007).CrossRefGoogle Scholar
47.Warren, O.L., Shan, Z.W., Syed Asif, S.A., Stach, E.A., Morris, J.W. Jr., Minor, A.M., Mater. Today 10 (4), 59 (2007).CrossRefGoogle Scholar
48.Gouldstone, A., Chollacoop, N., Dao, M., Li, J., Minor, A.M., Shen, Y.L., Acta Mater. 55, 4015 (2007).CrossRefGoogle Scholar
49.Sun, Y., Ye, J., Shan, Z.W., Minor, A.M., Bulk, T.J., JOM 59(9), 54 (2007).CrossRefGoogle Scholar
50.Hemker, K.J., Nix, W.D., Nat. Mater. 7, 97 (2008).CrossRefGoogle Scholar
51.Shan, Z.W., Mishra, R.K., Syed Asif, S.A., Warren, O.L., Minor, A.M., Nat. Mater. 7, 115 (2008).CrossRefGoogle Scholar
52.Shan, Z.W., Li, J., Cheng, Y.Q., Minor, A.M., Syed Asif, S.A., Warren, O.L., Ma, E., Phys. Rev. B 77, 155419 (2008).CrossRefGoogle Scholar
53.Shan, Z.W., Adesso, G., Cabot, A., Sherburne, M.P., Syed Asif, S.A., Warren, O.L., Chrzan, D.C., Minor, A.M., Alivisatos, A.P., Nat. Mater. (2008), in press.Google Scholar
54.Schuh, C.A., Mater. Today 9(5), 32 (2006).CrossRefGoogle Scholar
55.Merkle, A., Marks, L.D., Eryilmaz, O., Erdimer, A., manuscript in preparation.Google Scholar
56.Kisielowski, C., Freitag, B., Bischoff, M., van Lin, H., Lazar, S., Knipels, G., Tiemeijer, P., van der Stam, M., von Harrach, S., Stekelenburg, M., Haider, M., Uhlemann, S., Muller, H., Hartel, P., Kabius, B., Miller, D., Petrov, I., Olson, E.A., Donchev, T., Kenik, E.A., Lupini, A.R., Bentley, J., Pennycook, S.J., Anderson, I.M., Minor, A.M., Schmid, A.K., Duden, T., Radmilovic, V., Ramasse, Q.M., Watanabe, M., Erni, R., Stach, E.A., Denes, P., Dahmen, U., Microscopy and Microanalysis 14, 469477 (2008).CrossRefGoogle Scholar